tag: thermal analysis

Improving Automotive Reliability
By Annapoorna Krishnaswamy - 16 Oct, 2017 - Comments: 0

Semiconductor reliability requirements are rapidly evolving. New applications such as ADAS/self-driving cars and drones are pushing the limits for system reliability. A mobile phone that overheats in your pocket is annoying. In automobiles, it's a much different story. Overheating can impact the operation of backup sensors, which alert the driver that a pedestrian or obstacle is behind them.... » read more

7nm Power Issues And Solutions
By Preeti Gupta - 16 Nov, 2016 - Comments: 0

Being able to achieve 35% speed improvement, 65% power reduction and 3.3X higher density makes adopting a 7nm process for your next system-on-chip (SoC) design seem like an easy decision. However, with $271 million in estimated total design cost and 500 man-years it would take to bring a mid-range 7nm SoC to production, companies need to carefully weigh the benefits against the cost of designin... » read more

How Software-Driven Tests Support Concurrent Power/Performance Analysis
By Steve Carlson - 13 Oct, 2016 - Comments: 0

There’s always been an intimate relationship between performance and power—and it’s one that is acutely affected by architecture. Architectural innovation can yield orders of magnitude improvements in performance/power metrics. For example, we’ve seen a growing popularity in multi-core and heterogeneous core systems with purpose-specific hardware accelerators. These configurations are o... » read more

Calibrating Electronics Thermal Simulation Models
By Robin Bornoff - 12 Feb, 2015 - Comments: 0

‘Rubbish In, Rubbish Out’ is a common and well-accepted fact in the world of thermal simulation—actually any type of simulation, for that matter. Regardless of the technical capabilities of your thermal simulation tool, the accuracy of prediction will always be tightly coupled to the accuracy of the input data. In terms of electronics thermal simulation, the prediction of the internal ... » read more

FinFET Reliability Issues
By Arvind Vel - 13 Mar, 2014 - Comments: 0

The 16nm FinFET node has introduced several new challenges in the IC design community. In addition to the complexity of power-noise and electromigration (EM) verification, thermal reliability has become a major concern for both chip and package designers. With the three-dimensional architecture of FinFET devices, new simulation approaches are being used to model thermal behavior of the die in o... » read more

Stacking The Deck
By Matt Elmore - 12 Jul, 2012 - Comments: 0

By Matt Elmore Can we finally say that 3D-IC design has emerged from the realm of theory and research to actual commercial implementation? Xilinx recently announced initial shipments of its Virtex-7 H580T FPGA, described as “The world’s first 3D heterogeneous all programmable product.” The benefits of 3D implementation are many, as are its challenges. One of the hottest 3D-IC topics t... » read more

New Reliability Issues
By Arvind Vel - 14 Jun, 2012 - Comments: 0

By Arvind Shanmugavel Reliability of ICs is a topic of growing concern with every technology node migration. With the onset of the 20nm process node from different foundries, reliability verification has taken center stage in design kits—and for good reason. Reliability margins have continued to decrease and have reached an inflection point at the 20nm node. The design and EDA communities ha... » read more

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