Closing The Power Integrity Gap


Voltage drop has always been a significant challenge. As far back as 130nm, specialist tools were being used to ensure that enough local decoupling capacitance (decap) cells were inserted in addition to larger decaps implemented around the SoC. But advanced nodes are complicating matters and further increasing complexity. These technological challenges, which underlie the power, performance ... » read more

Power Breaks Everything


The emphasis on lowering power in everything from wearable electronics to data centers is turning into a perfect storm for the semiconductor ecosystem. Existing methodologies need to be fixed, techniques need to be improved, and expectations need to be adjusted. And even then the problems won't go away. In the past, most issues involving power—notably current leakage, physical effects such... » read more

How Switching Activity Impacts A Design’s Power And Reliability


Electronics continue to gain presence in both familiar and unfamiliar areas of our lives. Electronics is a common thread among the cars we drive, the computers we use, the mobile phones and wearable devices that we rely on. We appreciate the information and convenience that Fitbits and other products such as coffee makers, credit cards and building security cards provide us. And we are beginni... » read more

IP Design Essentials For Power Integrity


Smart connectivity is the new mantra of today – the ability to connect to anything, anywhere and at any time. With such technology enablement, low power is not a choice but an expectation. Whether it is a connected device, or a system that is part of the infrastructure, they are driven to integrate various functionality such as high speed computing, high-speed memory, memory interfaces, radio... » read more

System-Aware SoC Power, Noise And Reliability Sign-off


In globally competitive markets for mobile, consumer and automotive electronic systems, the critical success factors are power consumption, performance and reliability. To manage these conflicting requirements, design teams consider multiple options, including the use of advanced process technology nodes — especially FinFET-based devices. These advanced technology nodes allow chips to operate... » read more

Power Noise And Reliability Sign-off For The Sub-20nm FinFET Era


There is a greater focus on power noise and reliability simulations and sign-off as the complexity of SoC designs continue to increase with 100+ different voltage islands, clock and power gating techniques, and multiple IPs each operating on different clock and power domains, etc. The technology node migration from 40nm to 20nm is driving requirements for electro-migration (EM) and reliability ... » read more