MIPI D-PHY RX⁺: An Optimized Test Configuration


With the proliferation of the mobile platform, the accelerating adoption of MIPI beyond the traditional mobile platform and into safety related applications, testability of MIPI® PHY is becoming a key requirement. While the D-PHY is the MIPI PHY with the widest adoption in the industry today, the RX+ is a D-PHY receiver configuration optimized for full-speed production testing. The presentatio... » read more

Benefits Of Multilevel Topologies In Power-Efficient Energy Storage Systems (ESS)


In this paper, we discuss the adaption of efficient energy storage systems (ESS) in residential solar and utility-scale applications. System requirements and possible topologies are looked into. For utility-scale, we introduce a multilevel converter topology concept. Click here to read more.   » read more

Load-Pull Analysis For Optimizing PA Performance


In load pull calculations, power amplifiers are going to need harmonic load pull analysis and load pull contours with wideband electromagnetic tuners. Working with RFIC power amplifiers is difficult for the myriad of concurrent design elements that they affect, transmission line voltage, signal interference, and impedance to name a few. In load pull calculations, power amplifiers are going t... » read more

Startup Funding: March 2021


Self-driving vehicles revved up investors in March, with two companies receiving over $200M apiece as they prepare for their systems to enter mass production. One focuses on software for passenger vehicles, while the other is looking to autonomous trucks. Both of the companies received investment from automakers, with China's largest carmaker SAIC joining each of the funding rounds. It was also... » read more

6 Steps To Successful Board Level Reliability Testing


For semiconductor manufacturers entering the automotive environment, the lack of universal qualifications standards often leads to inconsistent reliability expectations. The most efficient solution is to establish a robust and thorough BLR testing plan that is uniquely designed for a specific manufacturer validated by a broad range of industry experiences. 6 Steps to Successful Board Level R... » read more

Automated Traceability Of Requirements In The Design And Verification Process Of Safety-Critical Mixed-Signal Systems


System-level design and verification of safety-critical hardware requires a consistent methodology which complies with industrial safety-standards, for example ISO 26262 for automotive applications. For certification of safety-critical systems, the development process has to implement and enforce a strict traceability of requirements, linking the requirement specification, the design implementa... » read more

Understanding Write Combining On Arm


Write Combining (WC) is a specialized memory type defined by the x86-64 architecture that is used for gathering multiple stores into burst transactions over the system bus. WC is commonly used on x86-64 platforms for interaction with I/O and other peripheral devices. In this whitepaper we provide an overview of the Arm architecture memory types that provide WC-like capabilities. In addition, t... » read more

Blog Review: April 7


Cadence's Paul McLellan checks out the US National Security Commission on Artificial Intelligence report and what it recommends for funding the development of AI as well as semiconductor manufacturing and research. Siemens EDA's Ray Salemi continues exploring Python for verification and shows how to use cocotb to create a simple bus functional model and connect it to a testbench. Synopsys... » read more

AI In Inspection, Metrology, And Test


AI/ML is creeping into multiple processes within the fab and packaging houses, although not necessarily for the purpose it was originally intended. The chip industry is just beginning to learn where AI makes sense and where it doesn't. In general, AI works best as a tool in the hands of someone with deep domain expertise. AI can do certain things well, particularly when it comes to pattern m... » read more

Sharing Secure Chip Data For Analytics


New approaches and standards are being developed to securely share manufacturing and test data across the supply chain, moves that have long been considered critical to the reliability of end devices and faster time to yield and profitability. It will take time before these methods become widespread in the IC supply chain. But there is increasing agreement these kinds of measures are essenti... » read more

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