5G And AI Raise Security Risks For IoT Devices
By Rambus - 11 Mar, 2020 - Comments: 0

This IDC Technology Spotlight, sponsored by Rambus, highlights the fifth generation of cellular network technology (5G) is scaling further in 2020, enabling a new wave of AI-powered end points. To remain competitive, manufacturers must implement enhanced security measures on edge and IoT devices designed for the increased performance in speed, latency, and connection density. Click here to r... » read more

System-Level Electro-Thermal Analysis of RDS(ON) for Power MOSFET
By Cadence - 11 Mar, 2020 - Comments: 0

Authors: Rajen Murugan1, Nathan Ai2, and C.T. Kao2 1 Texas Instruments, Inc., Dallas, Texas, 75044, USA 2 Cadence Design Systems, Santa Clara, California, USA A coupled-electro-thermal RDS(ON) (drain to source ON resistance) co-analysis methodology for Power MOSFET is proposed. The methodology contains two functional modules: 1) physical field solvers and 2) equivalent circuit/network so... » read more

Testing Embedded MRAM IP For SoCs
By Synopsys - 11 Mar, 2020 - Comments: 0

The challenges of embedded memory test and repair are well known, including maximizing fault coverage to prevent test escapes and using spare elements to maximize manufacturing yield. With the surge in availability of promising non-volatile memory architectures to augment and potentially replace traditional volatile memories, a new set of SoC level memory test and repair challenges are emerging... » read more

Test Is Becoming A Horizontal Process
By Ed Sperling - 10 Mar, 2020 - Comments: 3

Semiconductor test, once a discrete part of a well-orchestrated series of manufacturing steps, is looking more like a process that extends from the early concept stage in design to the end of life of whatever system that chip ultimately is used for. This has important ramifications for safety-critical markets in general, and the semiconductor industry in particular. Both worlds have been inc... » read more

MRAM Process Development And Production Briefing
By Jeff Barnum - 10 Mar, 2020 - Comments: 0

By Dr. Meng Zhu, Dr. Roman Sappey, and Jeff Barnum MRAM (Magnetoresistive Random-Access Memory) is a type of non-volatile memory (NVM) that utilizes magnetic states to store information. The basic structure of MRAM is a magnetic-tunnel junction (MTJ), which consists of two ferromagnetic (FM) layers separated by an insulating tunnel barrier (Fig.1). When the magnetizations of the two magnetic... » read more

Test Costs Spiking
By Ed Sperling - 10 Mar, 2020 - Comments: 1

The cost of test is rising as a percentage of manufacturing costs, fueled by concerns about reliability of advanced-node designs in cars and data centers, as well as extended lifetimes for chips in those and other markets. For decades, test was limited to a flat 2% of total manufacturing cost, a formula developed prior to the turn of the Millennium after chipmakers and foundries saw the traj... » read more

Improving Functional Safety For ICs
By Mohammed Abdelwahid - 10 Mar, 2020 - Comments: 0

The exponential growth of electronics in automobiles have stimulated significant innovation towards the development of advanced safety mechanisms. In addition to very high-quality manufacturing test, ICs for safety-critical applications need in-system test to detect faults and monitor circuit aging. Scan-based logic built-in-self-test (LBIST) is the technique used for in-system test, but tradit... » read more

Taming Novel NVM Non-Determinism
By Bryon Moyer - 10 Mar, 2020 - Comments: 1

New memory technologies may have non-deterministic characteristics that add calibration to the test burden — and may require recalibration during their lifetime. Many of these memories are in development as a result of the search for a storage-class memory (SCM) technology that can bridge the gap between larger, slower memories like flash and faster DRAM memory. There are several approache... » read more

What’s WAT? Testing At The End Of Manufacturing
By Marie Ryan - 10 Mar, 2020 - Comments: 0

The high costs of building, resourcing and operating a foundry fabricating integrated circuits are well known. Fabless companies avoid this capital cost and focus on design and innovation in their area of expertise. On the other hand, the fabless company relies on the expertise and skills of the foundry to produce quality wafers. Many times a process used by a fabless company to manufacture... » read more

Manufacturing Optimization With Digital Thread
By Michael Schuldenfrei - 10 Mar, 2020 - Comments: 0

Data is everywhere, and if you know what to do with it, can be tremendously valuable. Huge volumes of data are collected in manufacturing industries across the supply chain, with the help of technologies such as IoT platforms, sensors, and edge devices. However, data is only as good as the value extracted from it, and getting the most out of data is challenging. Because information is often con... » read more

← Older posts Newer posts →

  • Sponsors

About

Navigation

Connect With Us

Copyright ©2013-2026 SMG   |  Terms of Service  |  Privacy Policy