category: Whitepapers

category: IoT, Security & Automotive

What’s Powering Artificial Intelligence
By Arm - 15 Jul, 2019 - Comments: 0

To scale artificial intelligence (AI) and machine learning (ML), hardware and software developers must enable AI/ML performance across a vast array of devices. This requires balancing the need for functionality alongside security, affordability, complexity and general compute needs. Fortunately, there’s a solution hiding in plain sight. To read more, click here (scroll down to "Download No... » read more

From Constraints to Tape-Out: Towards A Continuous AMS Design Flow
By Fraunhofer EAS - 15 Jul, 2019 - Comments: 0

The effort in designing analog/mixed-signal (AMS) integrated circuits is characterized by the largely manual work involved in the design of analog cells and their integration into the overall circuit. This inequality in effort between analog and digital cells increases with the use of modern, more complex technology nodes. To mitigate this problem, this paper presents four methods to improve ex... » read more

The Power Of Integrating Bluetooth Low Energy Into SoCs
By Synopsys - 15 Jul, 2019 - Comments: 0

The Bluetooth Low Energy (BLE) specification, released in 2011, enables designers of System-on-Chips (SoCs) to maximize the battery life of IoT devices and minimize the implementation costs of wireless sensors and other “connected things” by maximizing sleep time and simplifying Radio operation. Because it is built on the established ecosystem of Bluetooth Classic for mobile phones and P... » read more

Effective Elements List And Transitive Natures Of UPF Commands
By Mentor, a Siemens Business - 15 Jul, 2019 - Comments: 0

Although UPF is very well defined through IEEE 1801 LRM, it is often difficult to comprehend many primitive and inherent features of individual UPF commands-options or relations between different varieties of UPF commands-options. In this paper, we provide a simplistic approach to find inherent links between UPF commands-options through their transitive nature. We also explain how these inheren... » read more

Differential Energy Analysis To Optimize Mobile GPU Power
By ANSYS - 15 Jul, 2019 - Comments: 0

Operating power has become one of the most important metrics for modern electronic devices. Qualcomm Technologies, a world-class mobile solution provider, significantly reduced power consumption in an already challenging market by performing power analysis at RTL using ANSYS PowerArtist. Qualcomm Technologies was able to reduce dynamic power by 10 percent through this approach. To read more,... » read more

Protecting Computing Systems in a Post-Meltdown/ Spectre World
By Rambus - 15 Jul, 2019 - Comments: 0

When Jann Horn of Google’s Project Zero posted a detailed blog titled “Reading privileged memory with a side-channel,” it set off a firestorm of activity as the post confirmed that secret information inside a computer could be accessed via two different attacks, Meltdown and Spectre. Essentially, both attacks utilize CPU data cache timing to efficiently exploit and leak informatio... » read more

Meeting ISO 26262 Requirements Using Tessent IC Test Solutions
By Mentor, a Siemens Business - 08 Jul, 2019 - Comments: 0

As the industry moves towards greater automation in vehicles, suppliers of the ICs used to drive the automotive electronic systems are rapidly adopting solutions to meet ISO 26262 requirements. The Tessent family of IC test products offers the highest defect coverage, in-system non-destructive memory test, hybrid ATPG/Logic BIST, and analog test coverage measurement. These technologies add up t... » read more

Smart Manufacturing Solutions: Build or Buy?
By Optimal Plus - 08 Jul, 2019 - Comments: 0

Enterprise smart manufacturing platforms have become an important part of the manufacturing ecosystem, especially in domains such as semiconductors and electronics. McKinsey & Company estimates, for example, that the quantity of process, product, and machine data collected on a daily basis in a typical fab quickly exceeds terabytes. If you add to this in-line and end-of-line inspection as w... » read more

SEM Analysis Reveals Real Cause Of Chip Failure
By DELTA, a part of FORCE Technology - 08 Jul, 2019 - Comments: 0

When it comes to ASIC design, DELTA’s motto is “first time right”. When the first wafers from the wafer fab showed severe electrical malfunction, we were extremely frustrated. To investigate the failure, the design team started electrical characterization of prototypes. Overall, a short between power and ground was observed and furthermore RF inputs exhibited strange VI characteristics. T... » read more

Advanced Features Of High Speed Digital I/O Devices: Double Data Rate
By National Instruments - 08 Jul, 2019 - Comments: 0

As clock speeds and data rates continue to increase, designers of digital integrated circuits are creating new ways to maximize the rate of data being sent into and out of digital devices. One such method is known as double data rate (DDR). With single data rate (SDR) devices, data is latched on either the rising or falling edges of the sample clock. A DDR device latches data on both the rising... » read more

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