category: Whitepapers

category: IoT, Security & Automotive

How to Design, Optimize and Validate Safe Laser Headlamps Through Virtual Experimentation
By ANSYS - 07 Nov, 2018 - Comments: 0

Today, car manufacturers and their suppliers are facing a real challenge: designing attractive laser headlamps that will illuminate the road without blinding drivers and pedestrians. Validating the safety of these headlight systems using physical prototypes would require millions of miles of night-driving testing and cost-prohibitive investment. Simulation is the only option for adequately a... » read more

Hack the Vote: The Simulation of Vote Hacking at DEF CON
By Rambus - 07 Nov, 2018 - Comments: 0

DEF CON, started in 1992 by the Dark Tangent, is the world’s largest running and underground hacking conference held annually at Caesar’s Palace in Las Vegas. It is a convention attended by various people from hackers, to journalists, to lawyers, to cybersecurity professionals, to federal government employees. At the second annual DEF CON Voting Village, a part of the convention that seeks ... » read more

Fusion Compiler: Comprehensive RTL-to-GDSII Implementation System
By Synopsys - 07 Nov, 2018 - Comments: 0

The semiconductor industry is going through a renaissance period with waves of technological advancements and innovation. There has been a significant uptick in demand for silicon in recent years, driven by market sectors including automotive, artificial intelligence, cloud computing, and internet of things (IoT) that have their own unique mix of design and implementation requirements. The mobi... » read more

Straight Talk On Design Tools And ISO 26262
By Mentor, a Siemens Business - 07 Nov, 2018 - Comments: 0

Understanding evolving functional safety goals is difficult. The good news is there are some first principles that apply for safety-minded engineers, including when it comes to evaluating software design tools used to create everything from the systems to the IC components, software and networks and that are so critical in automotive design today. The best advice is a twist on the “think glob... » read more

Prediction of SRAM Reliability Under Mechanical Stress Induced by Harsh Environments
By Fraunhofer EAS - 07 Nov, 2018 - Comments: 0

On the example of a 28nm SRAM array, this work presents a novel reliability study which takes into account the effect of externally applied mechanical stress in circuit simulations. This method is able to predict the bit failures caused by the stress via the piezoresistive effect. The stability of each single SRAM cell is simulated using static noise margin. Finally, the whole array’s behavio... » read more

Delivering Superior Throughput for EDA Verification Workloads
By Cadence - 07 Nov, 2018 - Comments: 0

Perhaps no industry is more competitive than modern electronics manufacturing and chip design. As consumers, we take it for granted that electronic devices continue to get faster, cheaper, and more capable with each generation. From smart watches to industrial controls to electronic heart-rate monitors, electronics manufacturers are challenged to build smarter, more complex devices leveraging s... » read more

5 Best Practices For Successfully Managing An ASIC Supply Chain
By DELTA, a part of FORCE Technology - 05 Nov, 2018 - Comments: 0

Managing an end-to-end ASIC supply chain is one of the primary challenges of chip projects. Not only is the process long and complex, but it involves multiple technologies, dependencies and stakeholders. In this paper, we've assembled five best practices to help you translate ASIC specifications into a final product through a smooth supply chain process, including: Avoid costly time-... » read more

System-Level Testing – The New Paradigm for Semiconductor Quality Control
By Astronics - 05 Nov, 2018 - Comments: 0

Covering the history and trends of system-level test for semiconductors, this solution brief discusses: The increasing complexities of testing advanced semiconductor integrated devices across a span of applications: automotive, mobile computing, wearables, and more; Semiconductor trends driving necessary shifts in testing methodologies including SiP, SoC, 3D finFETs, heterogeneous compo... » read more

Design, System Integration and Testing of Radar Systems
By National Instruments - 05 Nov, 2018 - Comments: 0

This article discusses some of the fundamental research and development challenges in both the digital and RF/millimeter wave domains (such as waveform generation, receiver algorithms and transmit/receive front ends) and addresses current and future directions in design, system integration and test. Radar applications are becoming more diverse and commercialization is accelerating due to sig... » read more

Layout Driven Design With L-Edit Photonics
By Mentor, a Siemens Business - 31 Oct, 2018 - Comments: 0

Advances in integrated circuit technology and fabrication have made it possible to leverage traditional CMOS fabrication processes and materials and apply them to the design of Photonic Integrated Circuits (PICs). The combination of PICs with traditional electronic integrated circuits, called integrated photonics, is the ability to move, modulate, and detect light on a single IC. While there is... » read more

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