High-Performance CoolSiC MOSFET Technology With Silicon-Like Reliability


The performance potential of SiC is indisputable. The key challenge to be mastered is to determine which design approach achieves the biggest success in applications. Click here to read more. » read more

Aprisa Place-And-Route For Low-Power SoCs


The Aprisa digital design software helps designers address the many challenges of low-power designs. Aprisa is the most flexible IC place-and-route tool on the market—it accepts all industry-standard power formats, has excellent correlation to third-party signoff tools, and is easy to install, set up, and use. With effective technology and impressive usability, the Aprisa software ensures cos... » read more

Energy-Efficient SoCs For The Zettabyte Era Using Power-Saving IP And System Design Techniques


As the modern world becomes increasingly connected, businesses and consumers alike are relying more and more on digital data. Behind the scenes, data centers that manage all of this digital data are a somewhat silent, yet impactful, part of this connectivity revolution. These data centers are lined with servers that process digital data for everything from social media status updates to analyti... » read more

HBM2E Raises The Bar For Memory Bandwidth


AI/ML training capabilities are growing at a rate of 10X per year driving rapid improvements in every aspect of computing hardware and software. HBM2E memory is the ideal solution for the high bandwidth requirements of AI/ML training, but entails additional design considerations given its 2.5D architecture. Designers can realize the full benefits of HBM2E memory with the silicon-proven memory s... » read more

PPA(V): Performance-Per-Watt Optimization With Variable Operating Voltage


Performance-per-watt has emerged as one of the highest priorities in design quality, leading to a shift in technology focus and design power optimization methodologies. Variable operating voltage possess high potential in optimizing performance-per-watt results but requires a signoff accurate and efficient methodology to explore. Synopsys Fusion Design Platform, uniquely built on a singular RTL... » read more

Autoencoder-Based Characterisation Of Passive IEEE 802.11 Link Level Measurements


Wireless networks are indispensable in today’s industrial manufacturing and automation. Due to harsh signal propagation conditions as well as co-existing wireless networks, transmission failures resulting in severe application malfunctions are often difficult to diagnose. Remote wireless monitoring systems are extremely useful tools for troubleshooting such failures.However, the completeness ... » read more

Bandwidth Utilization Side-Channel On ML Inference Accelerators


Abstract—Accelerators used for machine learning (ML) inference provide great performance benefits over CPUs. Securing confidential model in inference against off-chip side-channel attacks is critical in harnessing the performance advantage in practice. Data and memory address encryption has been recently proposed to defend against off-chip attacks. In this paper, we demonstrate that bandwidth... » read more

Failure Modes Of Wearable Electronics


Society has been enamored with wearable electronics for many years. From FitBit to Google Glass to Apple Watch, taking electronic technology to the next level has fascinated us. Wiki defines wearable computers (also known as body-borne computers or wearables) as miniature electronic devices that are worn by the bearer under, with or on top of clothing. This class of wearable technology has been... » read more

Reversible Chain Diagnosis


For advanced technologies, the industry is seeing very complicated silicon defect types and defect distribution. One consequence is that scan chain diagnosis becomes more difficult. To improve the resolution of scan chain diagnosis, Tessent Diagnosis can use new scan chain test patterns to leverage a reversible scan chain architecture. This paper describes the novel scan chain architecture t... » read more

Industrial Radiography — CT Scanning for Metrology Applications


Xray technology, more specifically computed tomography (CT), has been adapted for use as an instrument of industrial metrology. Early adopters have quickly recognized the benefits of internal and external nondestructive testing for 3D defect detection and geometric analysis, while those considering adoption may be uncertain how to implement the technology effectively. This study was conducted t... » read more

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