The 48th annual gathering will look at the latest in test technology.
Machine learning is a hot topic at many technical conferences this year. It will be true at the upcoming International Test Conference, which opens near the end of this month in Fort Worth, Texas.
On Sunday, October 29, there are two tutorials devoted to machine learning. Monday, October 30, will have one tutorial related to the topic.
The conference gets fully under way on Halloween, with the exhibition and the technical program. The technical sessions will include a special session on machine learning, with three papers. There are seven other papers related to machine learning to be presented, along with a panel session, “Yield Learning at the Crossroads – Test Chips to the Rescue?”
Wrapping up #itctestweek is a workshop, Machine Learning Day, on Friday, November 2, with a keynote presented by Siemens and seven talks on various topics.
ITC’s technical program runs Monday through Thursday, with many different topics, such as diagnosis, benchmarks, automatic test pattern generation, security, memory test and repair, design for test, functional and software-based test, automotive IC safety and test, and system-level test.
There will be 32 exhibitors at ITC, including Advantest, Astronics Test Systems, Mentor Graphics, Optimal+, Synopsys, and Tektronix.
The ITC dates back to a 1970 symposium held at the Rickshaw Inn in Cherry Hill, New Jersey. The IEEE Philadelphia Section continues to sponsor the conference, along with the IEEE. The conference was known as “Cherry Hill” for years, although it has been held in several locales, including Anaheim, Calif.; Austin, Texas; Seattle, Wash.; and Washington, D.C.
 |
 |
 |
 |
 |
 |
 |
 |
 |
 |
Leave a Reply