Author's Latest Posts


Preparing For Bigger Changes Ahead


The semiconductor industry has undergone a fundamental shift over the past year, and it's one that will redefine chipmaking over the next decade or more. While the focus is still on building the fastest, lowest-power devices, whether that's by shrinking features or packaging them into blazing-fast 2.5D or fan-out configurations, these devices are being customized for specific use cases much ... » read more

Custom Vs. Non-Custom Design


Semiconductor Engineering sat down to discuss custom designs with Yong Pang, head of North American operations for [getentity id="22217" e_name="Imec"]; Phil Burr, director of portfolio product management for [getentity id="22186" e_name="Arm's"] embedded and automotive groups; Ambar Sarkar, chief technologist at eInfochips; and John Tinson, vice president of sales at Sondrel. What follows are ... » read more

The Trouble With Models


Models are becoming more difficult to develop, integrate and utilize effectively at 10/7nm and beyond as design complexity, process variation and physical effects add to the number of variables that need to be taken into account. Modeling is a way of abstracting the complexity in various parts of the semiconductor design, and there can be dozens of models required for complex SoCs. Some are ... » read more

Silicon’s Long Game


The era of all-silicon substrates and copper wires may be coming to an end. Progress in the future increasingly depends on more exotic combinations of materials that are developed for specific applications. But after years of predicting the death of silicon, it appears those predictions may be premature. That's not always obvious, given the growing number of chemical combinations being creat... » read more

The Next 5 Years Of Chip Technology


Semiconductor Engineering sat down to discuss the future of scaling, the impact of variation, and the introduction of new materials and technologies, with Rick Gottscho, CTO of [getentity id="22820" comment="Lam Research"]; Mark Dougherty, vice president of advanced module engineering at [getentity id="22819" comment="GlobalFoundries"]; David Shortt, technical fellow at [getentity id="22876" co... » read more

Noise At 7nm And Beyond


The digital and analog worlds always have been very different. Digital engineers see the world in terms of electrons and a well-defined set of numerical values. Their waves are discrete and squared off and their devices are often noisy when they turn on and off. Analog engineers think in terms of quiet, smooth waves, and they are very concerned about anything that can disrupt those waves, such ... » read more

Tech Talk: EM Crosstalk


Anand Raman, senior director at Helic, talks about the impact of electromagnetic interference on digital design at 10/7nm and beyond. Once confined to the analog space, noise is suddenly an issue at advanced nodes for all designs. At the root of the problem are smaller nodes, increased speed and higher levels of integration. https://youtu.be/hzZqK2lNJNQ » read more

Tech Talk: Substrate Noise Coupling


Roland Jancke, head of the department for design methodology for the Fraunhofer's Engineering of Adaptive Systems Division, talks with Semiconductor Engineering about the impact of substrate noise coupling on reliability of chips and how to deal with this issue. https://youtu.be/7E2rCwYr6-o » read more

Tech Talk: 802.11ax Multi-User


Daniel Webb, staff marketing manager at Marvell, talks about the new wireless standard, what's needed to make it work, and why it's so critical in the home and office. https://youtu.be/xIG7J928XFs » read more

Advanced Packaging Is Suddenly Very Cool


The hottest chip markets today—automotive AI for autonomous and heavily assisted driving, machine learning, virtual and augmented reality—all are beginning to look at advanced packaging as the best path forward for improving performance and reducing power. Over the past four years, which is when 2.5D and fan-out wafer-level packaging first really began garnering interest, these and othe... » read more

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