Sensor Fusion Challenges In Automotive


The number of sensors in automobiles is growing rapidly alongside new safety features and increasing levels of autonomy. The challenge is integrating them in a way that makes sense, because these sensors are optimized for different types of data, sometimes with different resolution requirements even for the same type of data, and frequently with very different latency, power consumption, and re... » read more

Fundamental Issues In Computer Vision Still Unresolved


Given computer vision’s place as the cornerstone of an increasing number of applications from ADAS to medical diagnosis and robotics, it is critical that its weak points be mitigated, such as the ability to identify corner cases or if algorithms are trained on shallow datasets. While well-known bloopers are often the result of human decisions, there are also fundamental technical issues that ... » read more

Design Considerations In Photonics


Experts at the Table: Semiconductor Engineering sat down to talk about what CMOS and photonics engineers need to know to successfully collaborate, with James Pond, fellow at Ansys; Gilles Lamant, distinguished engineer at Cadence; and Mitch Heins, business development manager for photonic solutions at Synopsys. What follows are excerpts of that conversation. To view part one of this discussion,... » read more

Blog Review: May 1


Cadence's Vatsal Patel stresses the importance of having testing and training capabilities for high-bandwidth memory to prevent the entire SoC from becoming useless and points to key HBM DRAM test instructions through IEEE 1500. In a podcast, Siemens' Stephen V. Chavez chats with Anaya Vardya of American Standard Circuits about the growing significance of high density interconnect and Ultra ... » read more

Framework For Early Anomaly Detection In AMS Components Of Automotive SoCs


A technical paper titled “Enhancing Functional Safety in Automotive AMS Circuits through Unsupervised Machine Learning” was published by researchers at University of Texas at Dallas, Intel Corporation, NXP Semiconductors, and Texas Instruments. Abstract: "Given the widespread use of safety-critical applications in the automotive field, it is crucial to ensure the Functional Safety (FuSa) ... » read more

Metrology For 2D Materials: A Review From The International Roadmap For Devices And Systems (NIST, Et Al.)


A technical paper titled “Metrology for 2D materials: a perspective review from the international roadmap for devices and systems” was published by researchers at Arizona State University, IBM Research, Unity-SC, and the National Institute of Standards and Technology (NIST). Abstract: "The International Roadmap for Devices and Systems (IRDS) predicts the integration of 2D materials into h... » read more

Centauri: Practical Rowhammer Fingerprinting Demonstrated On DRAM Modules (UC Davis)


A technical paper titled “Centauri: Practical Rowhammer Fingerprinting” was published by researchers at UC Davis. Abstract: "Fingerprinters leverage the heterogeneity in hardware and software configurations to extract a device fingerprint. Fingerprinting countermeasures attempt to normalize these attributes such that they present a uniform fingerprint across different devices or present d... » read more

Chip Industry Technical Paper Roundup: April 30


These new technical papers were recently added to Semiconductor Engineering’s library. [table id=222 /] Find more technical papers here. » read more

Research Bits: April 30


Sound waves in optical neural networks Researchers from the Max Planck Institute for the Science of Light and Massachusetts Institute of Technology found a way to build reconfigurable recurrent operators based on sound waves for photonic machine learning. They used light to create temporary acoustic waves in an optical fiber, which manipulate subsequent computational steps of an optical rec... » read more

Overlay Optimization In Advanced IC Substrates


Overlay is becoming a significant problem in the manufacturing of semiconductors, especially in the world of advanced packaging substrates — think panels — the larger the area, the greater the potential for distortion due to warpage. Solving this issue requires more accurate models, better communication through feed forward/feed back throughout the flow, and real-time analytics that are bak... » read more

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