category: Test, Measurement and Analytics

category: IoT, Security & Automotive

Lower Process Nodes Drive Timing Signoff Software Evolution
By Synopsys - 10 Nov, 2020 - Comments: 0

A dramatic rise in design complexity has led to a slew of new signoff challenges that impact the ability to predictably meet PPA targets. Smaller technology nodes and larger design sizes have caused the number of corners and modes to grow exponentially leading to much longer turnaround times for timing signoff. Moreover, larger design sizes demand huge compute resources for timing signoff. I... » read more

Adaptive Test Gains Ground
By Anne Meixner - 10 Nov, 2020 - Comments: 0

Not all devices get tested the same way anymore, and that’s a good thing. Quality, test costs, and yield have motivated product engineers to adopt test processes that fall under the umbrella of adaptive test, which uses test data to modify a subsequent test process. But to execute such techniques requires logistics that support analysis of data, as well as enabling changes to a test based ... » read more

Does HW Vs. SW Choice Affect Quality And Reliability?
By Bryon Moyer - 10 Nov, 2020 - Comments: 0

Electronic systems comprise both hardware and software. Which functions are implemented with hardware and which with software are decisions made based upon a wide variety of considerations, including concerns about quality and reliability. Hardware may intrinsically provide for higher device quality, but it is also the source of reliability concerns. This is in contrast with popular views of... » read more

High Throughput Noise Measurements
By Peter Andrews - 10 Nov, 2020 - Comments: 0

Flicker noise and random telegraph noise (RTN) testing can take a long time, especially when measuring down to frequencies of 1 Hz or below. Sweep times up to 30 min at a single temperature are common. And standard data collection for device models requires DUT data at multiple temperatures on small pads. To lower Cost of Test (CoT), and significantly increase on-wafer test throughput, a... » read more

Industry 4.0 And The Rise Of QPaaS
By Optimal Plus - 10 Nov, 2020 - Comments: 0

McKinsey & Company frames this shift as a matter of moving the industry from its current approach of “firefighting” – responding to failures and vulnerabilities after they’re brought to OEMs’ attention – toward proactively preventing such episodes in the first place. How can the industry achieve this objective? By embracing quality protection as a service (QPaaS) — an approach... » read more

Benefits Of Outsourcing Yield Management Software
By Marie Ryan - 10 Nov, 2020 - Comments: 0

Microchip is a longtime yieldHUB customer. We work with a number of divisions worldwide. We spoke to Kasia Metlička-Sawicka, an Engineering Release Supervisor, Senior Engineer II-Product in Microchip Ireland to find out why she likes using our system. What do you do? I’m an Engineering Release supervisor/Senior Product Engineer. I oversee the engineering release group of technicians... » read more

Chips Good Enough To Bet Your Life On
By Ed Sperling - 10 Nov, 2020 - Comments: 0

Semiconductor Engineering sat down to discuss automotive electronics reliability with Jay Rathert, senior director of strategic collaborations at KLA; Dennis Ciplickas, vice president of advanced solutions at PDF Solutions; Uzi Baruch, vice president and general manager of the automotive business unit at OptimalPlus; Gal Carmel, general manager of proteanTecs' Automotive Division; Andre van de ... » read more

Dealing With Two Very Different Sides Of 5G
By Ed Sperling - 09 Nov, 2020 - Comments: 0

Semiconductor Engineering sat down to discuss 5G reliability with Anthony Lord, director of RF product marketing at FormFactor; Noam Brousard, system vice president at proteanTecs; Andre van de Geijn, business development manager at yieldHUB; and David Hall, head of semiconductor marketing at National Instruments. What follows are excerpts of that conversation. To view part one of this discussi... » read more

Case Study: Monitoring Humidity To Reduce Reticle Haze Effects
By CyberOptics - 09 Nov, 2020 - Comments: 0

Understanding reticle haze: Without proper control measures, immersion technology scanners are affected by an adverse phenomenon called “haze.” Haze is caused by a combination of three specific factors: Click here to continue reading. » read more

Combining Machine Learning With Advanced Outlier Detection To Improve Quality And Lower Cost
By PDF Solutions - 09 Nov, 2020 - Comments: 0

In semiconductor manufacturing, a low defect rate of manufactured integrated circuits is crucial. To minimize outgoing device defectivity, thousands of electrical tests are run, measuring tens of thousands of parameters, with die that are outside of specified parameters considered as fails. However, conventional test techniques often fall short of guaranteeing acceptable quality levels. Given t... » read more

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