ACAP At The Edge With The Versal AI Edge Series


This white paper introduces the AI Edge series to the Versal ACAP portfolio, a domain-specific architecture (DSA) that meets the strenuous demands of systems implemented in the 7nm silicon process. This series is optimized to meet the performance-per-watt requirements of edge nodes at or near the analog-digital boundary. Here, immediate response to the physical world is highly valued, and in ma... » read more

SoC Verification From Pre-Fabrication To The Over-the-Air Update


The recent new of attacks on system infrastructures serves to highlight that hardware vulnerabilities in the supply chain are not only possible but inevitable if proper precautions are ignored. Verification throughout the entire supply chain is necessary to ensure the safety and security of hardware. Starting as early as the pre-fabrication stage, vulnerabilities, if left unchecked, can be an o... » read more

Internet of Things (IoT)


The wide range of internet of things (IoT) applications in development today are made possible by smart devices operating across different network configurations, frequencies, power requirements, and protocols. Developing cost-effective IoT solutions requires a smart, organized approach to radio and antenna integration within a design flow that may have little to do with traditional RF product ... » read more

Verilog HDL And Its Ancestors And Descendants


This paper describes the history of the Verilog hardware description language (HDL), including its influential predecessors and successors. Since its creation in 1984 and first sale in 1985, Verilog has completely revolu- tionized the design of hardware. Verilog enabled the development and wide acceptance of logic synthesis. For large-scale digital logic design, previous schematic-based techniq... » read more

Using A System Technology Co-Optimization (STCO) Approach For 2.5/3D Heterogeneous Semiconductor Integration


With the economics of transistor scaling no longer universally applicable, the industry is turning to innovative packaging technologies to support system scaling demands and achieve lower system cost. This has led to the system technology co-optimization (STCO) concept, where a SoC type system is disaggregated, or partitioned, into smaller modules (also known as chiplets) that can be asynchrono... » read more

IP Solutions For A Data-Centric World


We’re in an era of sizeable growth in data and compute demand, along with increasing global data traffic. As a result, high-performance computing, data communications, networking, and storage systems are taking center stage in many application areas, driven by newer applications such as analytics, artificial intelligence (AI), genomics, and simulation-intensive workloads. Power efficiency, hi... » read more

Debugging Point-to-Point Resistance Using Contribution By Layer In IC Validator PERC


PERC Point-to-point resistance (P2P resistance) functionality is a crucial EDA technology to enable complex P2P effective resistance measurement along ESD paths in automation for foundry qualified ESD/Latch-up checker or in-house custom checker. This technology is applied to the entire chip, block, and IP designs on cell or transistor level layout database. Since the ESD path count could grow t... » read more

An Advanced Infrastructure To Enable Secure, Cloud-Aware Design And Processed Data EDA Tool Interoperability


By Rajeev Jain, Kerim Kalafala, and Ramond Rodriguez Significant technology disruptions are on the horizon that will provide massive efficiency gains for EDA tool suppliers and semiconductor companies alike. These disruptions include the application of artificial intelligence and machine learning to enhance supplier tools and optimize user design flows and methodologies, and the ensuing migr... » read more

High Thermal Die-Attach Paste Development For Analog Circuits


In recent years, various die attach (DA) materials have been developed to cope with the higher power dissipation requirements of semiconductor devices. DA materials based on metals such as solder or sintered silver (Ag) are used for very high heat generating power devices. While they show outstanding thermal performance, the mechanical properties of these materials are less than ideal. This lim... » read more

Process Model Calibration: The Key To Building Predictive And Accurate 3D Process Models


The semiconductor industry has always faced challenges caused by device scaling, architecture evolution, and process complexity and integration. These challenges are coupled with a need to provide new technology to the market quickly. In the initial stages of semiconductor technology development, innovative process flow schemes must be tested using silicon test wafers. These wafer tests are len... » read more

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