tag: finFETs

Optimization Challenges For 10nm And 7nm
By Brian Bailey - 11 Aug, 2016 - Comments: 0

Optimization used to be a simple timing against area tradeoff, but not anymore. As we go to each new node the tradeoffs become more complicated, involving additional aspects of the design that used to be dealt with in isolation. Semiconductor Engineering sat down to discuss these issues with Krishna Balachandran, director of product management for low-power products at [getentity id="22032"... » read more

What’s Important For IoT—Power, Performance Or Integration?
By Ed Sperling - 04 Aug, 2016 - Comments: 0

Semiconductor Engineering sat down with Steve Hardin, director of product development for AT&T's IoT Solutions Group; Wayne Dai, CEO of VeriSilicon; John Koeter, vice president of the Solutions Group at [getentity id="22035" e_name="Synopsys"]; and Rajeev Rajan, vice president for IoT at [getentity id="22819" comment="GlobalFoundries"]. What follows are excerpts of that conversation. SE:... » read more

Executive Insight: Jack Harding
By Ed Sperling - 03 Aug, 2016 - Comments: 0

[getperson id="11145" comment="Jack Harding"], president and CEO of [getentity id="22242" e_name="eSilicon"], sat down with Semiconductor Engineering to talk about consolidation, business relationships, what it will take to survive in the IoT age, and how to better optimize chips. What follows are excerpts of that conversation. SE: We’ve been looking at consolidation for a while and all th... » read more

New Drivers For Test
By Brian Bailey - 28 Jul, 2016 - Comments: 0

Mention Design for Test (DFT) and scan chains come to mind, but there is much more to it than that—and the rules of the game are changing. New application areas such as automotive may breathe new life into built-in self-test (BIST) solutions, which could also be used for manufacturing test. So could DFT as we know it be a thing of the past? Or will it continue to have a role to play? Te... » read more

Stacked Die Changes
By Ed Sperling - 27 Jul, 2016 - Comments: 0

Semiconductor Engineering sat down to discuss advanced packaging with David Pan, associate professor in the department of electrical and computer engineering at the University of Texas; Max Min, senior technical manager at Samsung; John Hunt, senior director of engineering at ASE; and Sitaram Arkalgud, vice president of 3D portfolio and technologies at Invensas. What follows are excerpts of tha... » read more

To 7nm And Beyond
By Ed Sperling - 21 Jul, 2016 - Comments: 4

Gary Patton, chief technology officer at [getentity id="22819" comment="GlobalFoundries"], and Thomas Caulfield, senior vice president and general manager of Fab 8, sat down with Semiconductor Engineering to discuss future directions in technology, including the next rev of FD-SOI, the future of Moore’s Law, and how some very public challenges will likely unfold. SE: What do you see as the... » read more

Executive Insight: Aart de Geus
By Ed Sperling - 20 Jul, 2016 - Comments: 0

Aart de Geus, chairman and co-CEO of Synopsys, sat down with Semiconductor Engineering to discuss Moore's Law, the IoT, inflection points and how chip design will evolve in coming years. SE: We are in the middle of possibly one of the biggest transition points we’ve ever seen in this industry. How do you envision things shaking out? De Geus: There is no question that there is an enormou... » read more

SoC Power Grid Challenges
By Brian Bailey - 14 Jul, 2016 - Comments: 7

The consumption of power and dissipation of heat within large SoCs has received a lot of attention recently, but that is only part of the issue. Power also has to be reliably delivered onto and around the system. This is becoming increasingly difficult, and new nodes are adding to the list of challenges. "If we were building chips where there was only a single Vdd and Vss then it is not that... » read more

Implementation Limits Power Optimization
By Ann Mutschler - 14 Jul, 2016 - Comments: 3

Implementation is still the step that makes or breaks power budgets in chip design, despite improvements in power estimation, power simulations, and an increase in the number of power-related architectural decisions. The reason: All of those decisions must be carried throughout the design flow. “If implementation decides to give up, then it doesn't really matter at the end of the day,” s... » read more

Near-Threshold Computing
By Brian Bailey - 16 Jun, 2016 - Comments: 2

The emergence of the Internet of Things (IoT) has brought a lot of attention to the need for extremely low-power design, and this in turn has increased the pressure for voltage reduction. In the past, each new process node shrunk the feature size and lowered the nominal operating voltage. This resulted in a drop in power consumption. However, the situation changed at about 90nm in two ways. ... » read more

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