tag: physical verification

Considering The Power Of The Cloud For EDA
By Michael White - 27 Oct, 2022 - Comments: 0

By Michael White, Siemens EDA, in technical collaboration with Peeyush Tugnawat, Google Cloud, and Philip Steinke, AMD At DAC 2022, Google Cloud, AMD, and Calibre Design Solutions presented an EDA in the cloud solution that enables companies to access virtually unlimited compute resources when and as needed to optimize their design and verification flows. If your company is considering addin... » read more

Meeting Today’s Challenges For LVS
By Manoz Palaparthi - 13 Oct, 2022 - Comments: 0

At least one thing is for certain in semiconductor development: bigger and more complex designs put lots of pressure on electronic design automation (EDA) tools and methodologies. Yesterday’s chip is today’s IP block, and entire racks of electronics are being packed into system-on-chip (SoC) devices. EDA tools must evolve constantly in order to keep pace with size and complexity while meeti... » read more

Earlier SoC Design Exploration And Verification Gets Better Designs To Tapeout Faster
By Nermeen Hossam - 25 Aug, 2022 - Comments: 0

By Nermeen Hossam and John Ferguson Between the complexity of advanced node design verification and the competition to be first to the market, system-on-chip (SoC) designers no longer have the luxury of waiting until each sub-block of a chip is DRC-clean to start their chip assembly and verification. Today’s SoC designers typically start chip integration in parallel with block development.... » read more

Signoff-Accurate Partial Layout Extraction And Early Simulation
By Soni Kapoor - 11 Aug, 2022 - Comments: 0

It is a rewarding experience for EDA developers and users to collaborate on deploying advanced techniques to improve design productivity. This blog will describe the experience of collaborating with customers on a new technology for reducing the number of analog design iterations. Analog design requires that engineers balance the needs to 1) reach market quickly 2) deliver high quality 3) at lo... » read more

2.5/3D IC Reliability Verification Has Come A Long Way
By Dina Medhat - 01 Aug, 2022 - Comments: 0

2.5D/3D integrated circuits (ICs) have evolved into an innovative solution for many IC design and integration challenges. As shown in figure 1, 2.5D ICs have multiple dies placed side-by-side on a passive silicon interposer. The interposer is placed on a ball grid array (BGA) organic substrate. Micro-bumps attach each die to the interposer, and flip-chip (C4) bumps attach the interposer to the ... » read more

Cutting Clock Costs On The Bleeding Edge Of Process Nodes
By Aakash Jani - 01 Aug, 2022 - Comments: 0

In a recent study done by McKinsey and IDC, we see that physical design and verification costs are increasing exponentially with shrinking transistor sizes. As figure 1 shows, physical design (PD) and pre-silicon verification costs are doubling each process leap. As companies leap from node to leading node, a natural question arises. Why is it becoming harder and more expensive to tapeout a chi... » read more

High-Performance 5G IC Designs Need High-Performance Parasitic Extraction
By Karen Chow - 23 Jun, 2022 - Comments: 0

By Karen Chow and Salma Ahmed Elhenedy We are rapidly approaching a future where 5G telecommunications will be the norm. With its increased data speeds and bandwidth, 5G has the potential to change the way we live our lives. But what does that mean for the average person? Think about cellphones, for one. You don't just use your phone for calling or texting anymore—you surf the web, chec... » read more

Improving PPA With AI
By John Koon - 12 May, 2022 - Comments: 0

AI/ML/DL is starting to show up in EDA tools for a variety of steps in the semiconductor design flow, many of them aimed at improving performance, reducing power, and speeding time to market by catching errors that humans might overlook. It's unlikely that complex SoCs, or heterogeneous integration in advanced packages, ever will be perfect at first silicon. Still, the number of common error... » read more

Dissolving The Barriers In Multi-Substrate 3D-IC Assembly Design
By Tarek Ramadan - 24 Feb, 2022 - Comments: 0

Advanced packaging continues to promise improved form factor, cost, performance, and functionality compared to the traditional transistor scaling on SoCs. This is done by integrating multiple dies on top of a substrate (organic or silicon). Besides multiple dies, multiple substrates can typically exist in a 3D-IC assembly. In this case, the benefits of advanced packaging are taken to a whole ne... » read more

Optimize Physical Verification Cost Of Ownership
By Manoz Palaparthi - 29 Jul, 2021 - Comments: 0

As semiconductor designs continue to grow in size and complexity, they put increasing pressure on every stage of the design process. Physical verification, often on the critical path to tape-out, is especially affected. Design rule checking (DRC), layout versus schematic (LVS), and other physical verification runs take longer as chip size increases. In addition, finer geometries introduce new c... » read more

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