How Many Test Miles Make A Vehicle Safe?
By Kevin Fogarty - 06 Aug, 2019 - Comments: 0

The road to reliable safety testing of autonomous vehicles (AVs) is shifting left. Standards groups are beginning to publish functional safety standards that could make it possible to verify what a machine-learning AV pilot application will do in a traffic situation even before hardware or software is released from validation testing. This kind of approach has been possible for some time in ... » read more

Hierarchical DFT On A Flat Layout Design
By Vidya Neerkundar - 06 Aug, 2019 - Comments: 0

The use of hierarchical DFT methods is growing as design size and complexity stresses memory requirements and design schedules.  Hierarchical DFT divides the design into smaller pieces, creates test structures and patterns at the core level, then retargets the core patterns to the chip level. But, if you need to perform the physical place and route on the full flat design, can you still take a... » read more

Using Better Data To Shorten Test Time
By Ed Sperling - 06 Aug, 2019 - Comments: 1

The combination of machine learning plus more sensors embedded into IC manufacturing equipment is creating new possibilities for more targeted testing and faster throughput for fabs and OSATs. The goal is to improve quality and reduce the cost of manufacturing complex chips, where time spent in manufacturing is ballooning at the most advanced nodes. As the number of transistors on a die incr... » read more

Who Is Responsible For Part Average Testing?
By Kevin Robinson - 06 Aug, 2019 - Comments: 0

With ever-increasing demands in the automotive industry, more and more semiconductor companies are interested in monitoring and improving quality and reliability. Outlier detection and more specifically Part Average Testing (PAT) is the industry standard for the automotive industry. But, who is responsible for quality? Historically, OSATs are responsible for this. In the past, once they... » read more

Yield Impact For Wafer Shape Misregistration-Based Binning For Overlay APC Diagnostic Enhancement
By KLA - 05 Aug, 2019 - Comments: 0

By David Jayez, Kevin Jock, Yue Zhou and Venugopal Govindarajulu of GlobalFoundries, and Zhen Zhang, Fatima Anis, Felipe Tijiwa-Birk and Shivam Agarwal of KLA. 1. ABSTRACT The importance of traditionally acceptable sources of variation has started to become more critical as semiconductor technologies continue to push into smaller technology nodes. New metrology techniques are needed to pur... » read more

ON Semiconductor Reduces Memory BiST Insertion Time By 6X With Tessent Hierarchical Flow
By Mentor, a Siemens Business - 05 Aug, 2019 - Comments: 0

This paper describes a case study on the insertion of memory BiST for an ON Semiconductor multi-million gate-level netlist with 300 memory instances. The physical implementation will be done using a flat layout. Two different methodologies can be applied when it comes to physical implementation; hierarchical or fullflat. When performing physical implementation as full-flat flow, typically the D... » read more

Manufacturing Bits: Aug. 5
By Mark LaPedus - 05 Aug, 2019 - Comments: 0

Chemical weapon sensors Using nanoelectromechanical system (NEMS) technologies and other parts, Sandia National Laboratories has developed a tiny gas chromatograph sensor for use in detecting toxic gases and chemical weapons. Chemical identification involves the use of various instruments and systems. Larger systems are used in the lab. A portable version, called a mass spectrometer, is ava... » read more

Big Data Trends Shaping Industry 4.0
By Optimal Plus - 05 Aug, 2019 - Comments: 0

In today’s highly competitive economy, automotive OEMs are under pressure to shorten production cycles and fully leverage production capacities, with no compromising of quality and safety. This ebook covers the three big data mega trends for the automotive value chain: ML and AI to streamline processes Actionable Insights Optimized product reliability Don’t lag be... » read more

Smart NiCs
By Ed Sperling - 05 Aug, 2019 - Comments: 1

Manish Sinha, strategic planning for marketing and business at Achronix, talks with Semiconductor Engineering about what’s changing in networking interface cards, how to get more performance out of these devices, and how much needs to be in hardware versus software. » read more

System Bits: Aug. 5
By Jeff Dorsch - 05 Aug, 2019 - Comments: 0

Algorithm could advance quantum computing Scientists at the Los Alamos National Laboratory report the development of a quantum computing algorithm that promises to provide a better understanding of the quantum-to-classical transition, enabling model systems for biological proteins and other advanced applications. “The quantum-to-classical transition occurs when you add more and more parti... » read more

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