Lasers Are The Heartbeat Of The Optical AI Data Center
By Geoff Tate - 13 May, 2026 - Comments: 0

Last month we discussed how all interconnects will be optical in the data center in five years, but that's only part of the story. Every optical interconnect needs a laser. The laser provides the carrier, which is modulated and manipulated by the transmitter optical engine through fibers and connectors to the receiver optical engine. Each fiber, connector, and photonics device that the laser... » read more

Scaling PCIe Controllers for AI Bandwidth: A Multistream Architecture Analysis for 64 GT/s and 128 GT/s
By Synopsys - 13 May, 2026 - Comments: 0

Scaling raw lane speed without rethinking controller microarchitecture leads to diminishing returns. It introduces multistream architecture, a controller‑level re‑architecture designed to sustain effective bandwidth under mixed and small‑packet workloads. This paper examines the architectural inflection point at PCIe 6.0, details transmit‑ and receive‑side changes required for multist... » read more

Blog Review: May 13
By Jesse Allen - 13 May, 2026 - Comments: 0

Siemens' Loay Hegazy, Mohamed Taher, and Sherif Hammouda describe a GPU rasterizer designed specifically for computational lithography and present benchmark results and practical implications for mask synthesis workflows. Cadence's Udaya Shankar introduces RTL, logic, and physical restructuring techniques and how they can help improve PPA, reduce dynamic power consumption, and optimize place... » read more

A Comprehensive Study Of Integrating 2D Materials With CFET Architecture (SKKU, et al.)
By Technical Paper Link - 12 May, 2026 - Comments: 0

A new technical paper, "Challenges and prospects of 2D electronics for future monolithic complementary field-effect transistors," was published by researchers at Sungkyunkwan University, Hanyang University, Istituto Italiano di Tecnologia, Shanghai University, Jeonbuk National University, and Kyonggi University. Abstract "With planar complementary metal-oxide-semiconductor (CMOS) scaling ... » read more

ANN Framework for Thermal-Aware Modeling of GAAFETs (NYCU)
By Technical Paper Link - 12 May, 2026 - Comments: 0

A new technical paper, "A Device-Physics-Informed Artificial Neural Network Approach for Thermal-Aware I-V and C-V Modeling of GAA FETs," was published by researchers at National Yang Ming Chiao Tung University. Abstract "This work introduces a device-physics-informed neural network framework for simultaneous modeling of thermal-aware I-V and C-V characteristics of gate-all-around (GAA) f... » read more

Silicon Photonics: Integrated Grating-Based Antennas for Optical Phased Arrays (MIT)
By Technical Paper Link - 12 May, 2026 - Comments: 0

A new technical paper, "Reduced-crosstalk antennas for grating-lobe-free and wide-field-of-view integrated optical phased arrays," was published by researchers at MIT. Abstract "Integrated optical phased arrays (OPAs) have emerged as a promising technology for many applications due to their ability to dynamically control free-space optical beams in a compact and non-mechanical manner. How... » read more

HW-Based Image Generation Using FTJs (SNU, Sungkyunkwan U., SK hynix et al.)
By Technical Paper Link - 12 May, 2026 - Comments: 0

A new technical paper, "CMOS-compatible ferroelectric tunnel junctions integrate stochastic sampling and deterministic computing for image generation," was published by researchers at Seoul National University, Sungkyunkwan University, Hanyang University, Sogang University, and SK Hynix. Abstract "Recent progress in generative modeling has intensified the need for compact, energy-efficien... » read more

Supporting Safety Requirements from RTL Exploration Through Implementation in Semiconductor Devices (Politecnico di Torino, Synopsys)
By Technical Paper Link - 12 May, 2026 - Comments: 0

A new technical paper, "Early Functional Safety and PPA evaluation for faster digital design development," was published by researchers at Politecnico di Torino and Synopsys. Abstract "The use of semiconductor devices in safety-critical applications is increasing in both volume and complexity. Applications in markets such as automotive, data centers, and aerospace have dependability requi... » read more

What’s Really Needed For Advanced Test?
By Greg Prewitt - 12 May, 2026 - Comments: 0

By Greg Prewitt and Marc Jacobs Advanced test has become one of the semiconductor industry's most promising frontiers: adaptive binning, feed-forward models, and real-time analytics pulling signals from mountains of measurement data. But there is a problem hiding underneath all that ambition, and it is neither compute nor algorithm; it is data. More specifically, it is the unglamorous, found... » read more

The Specialty Device Surge Part 3: Solving The Process Control Challenges Of MEMS, Photonics, Co-Packaged Optics, And More
By Christopher Haire - 12 May, 2026 - Comments: 0

Every day, consumers rely on an invisible network of specialty semiconductor devices without realizing it. The smartphone in your pocket is a good place to start. It knows when you rotate the screen thanks to MEMS sensors, and its camera delivers crisp images through advanced CMOS image sensors. Meanwhile, fast charging technology, wireless connectivity, facial recognition, and high-frequency c... » read more

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