Silicon Lifecycle Management: Actionable Silicon Insights Through Intelligent Measurement And Analysis


Semiconductors have always been challenging to develop, with many waves of innovation in electronic design automation (EDA) tools and fabrication technologies barely keeping ahead of ever-growing design size and sophistication. Once again, the industry has reached a tipping point. The combination of increasing chip and system complexity, coupled with higher expectations for product performance ... » read more

Atomic Force Microscopy Covers The Landscape Of Polymer Characterization


"Materials scientists designing a polymer-based material for a specific application must analyze how and why all these factors come together to impact the final product. Understanding the structure and properties at the microscopic level is critical to a complete understanding of the material. “Everybody wants to make their materials perform better at the macroscale,” says Bede Pittenger, a... » read more

New Method For BEOL Overlay And Process Margin Characterization


This paper presents a new method, design for inspection (DFI) to characterize overlay. Using design-assisted voltage contrast measurement, the method enables in-line test and monitoring of process induced OVL and CD variation of backend-of line (BEOL) features with litho-etch-lithoetch (LELE) patterning. While only some of the features of multi-color patterning scheme are chosen to be aligned d... » read more

Measurement Of Deep Trenches To Study The RIE Lag Effect


The demand for accurate characterization of high aspect ratio geometries such as narrow gaps, deep trenches or deep holes arises in many technologies and industries. A variety of metrology techniques have been utilized to accommodate these needs. Among the candidates for this type of metrology, 3D optical profiling characterization is becoming more and more prevalent in process control. Due to ... » read more

System Level Test — A Primer


As semiconductor geometries become smaller and greater complexity is pushed into chips or packages, System Level Test (SLT) is becoming essential. SLT is testing a device under test (DUT) as it is used in the end-use system, by merely using it rather than creating test vectors, as is done with traditional automated test equipment (ATE). Tests are still written but in a different way… Pete... » read more

Verification And Validation Of Automotive Safety Element Out Of Context


With the increased use of electronics and software in the automotive systems, there are strict requirements for complex functions to perform safely and avoid causing damages to life and property in case of a failure. With the technology getting more complex, there are increasing risks from systematic failures and random hardware failures that need to be considered within the scope of functional... » read more

Software Controlled Modular FPGA


Flex Logix has developed embedded FPGA IP (EFLX® embedded FPGA or eFPGA) that has been licensed for use in many commercial, aerospace and defense programs. It has also developed an edge inferencing accelerator, InferX® to efficiently process AI edge inferencing workloads requiring high throughput for the least power and area. This paper describes managing and dynamically programming eFPGA des... » read more

3 Reasons Why Your Payment App Needs To Get EMVCo Certified And How App Shielding Can Help You Get There


EMVCo certification and solutions There are several reasons why mobile payment app providers need to get an EMVCo Software-Based Mobile Payment (SBMP) certification. Some of the reasons to choose the EMVCo certification are: Ensuring the security of the solution Easing the acceptance by the largest card brands Layered approach The evaluation process for software-based payment sol... » read more

Data Retention Performance Of 0.13µm F-RAM Memory


F-RAM (Ferroelectric random access memory) is a non-volatile memory that uses a ferroelectric capacitor for storing data. It offers higher write speeds over flash/EEPROM. This white paper provides a brief overview of data retention performance of F-RAM memory. Click here for more. » read more

Navigating The Intersection Of Safety And Security


Vehicle systems and the semiconductors used within them are some of the most complex electronics seen today. In the past, electronics going into vehicle systems implemented flat architectures with isolated functions controlling various components of the power train and vehicle dynamics. However, to support the realization of Level 4 and Level 5 (L4/L5) autonomous driving, a massive restructure ... » read more

← Older posts Newer posts →