category: Whitepapers

category: IoT, Security & Automotive

A Revolution For Power Conversion Systems — CoolSiC MOSFET
By Infineon - 09 Jun, 2021 - Comments: 0

Silicon carbide (SiC) transistors are increasingly used in power converters, placing high demands on the size, weight and/or efficiency. The outstanding material properties of SiC enable the design of fastswitching unipolar devices as opposed to bipolar IGBT devices. Thus, solutions which have been up to now possible in the low-voltage world only (< 600 V) are now possible at higher voltages... » read more

Failure Mechanism Detection Algorithm With MOSFET Body Diode
By Fraunhofer IIS/EAS - 09 Jun, 2021 - Comments: 0

Autonomous driving is playing a big role in the automotive industry and defines the future of mobility on a big scale. However, autonomous driving faces several challenges, such as the performance of artificial intelligence and hardware reliability. To ensure safe functionality, the reliability of the electronic components plays an essential role and must be taken into consideration. One aspect... » read more

The Emergence Of Inline Screening For High Volume Manufacturing
By KLA - 08 Jun, 2021 - Comments: 0

The semiconductor content of automobiles is growing rapidly in applications where quality is of paramount importance, and automotive manufacturers have taken the lead in driving a “Zero Defect” mentality into their supply chain. The motivation behind this paper started with engagements with semiconductor suppliers as well as automotive manufacturers, where KLA witnessed many clear examples ... » read more

Characterization Of CMP Processes With White Light Interferometry
By Bruker - 08 Jun, 2021 - Comments: 0

Faster computer and electronic processors require smaller features for integrated circuits (IC), which in turn require smaller and smoother substrate surfaces. Chemical mechanical polishing (CMP) has become one of the most critical semiconductor fabrication technologies because it offers a superior means of removing unwanted topography in interlevel dielectric layers and achieving sufficient pl... » read more

In-field, In-Mission Reliability Monitoring Based On Deep Data
By proteanTecs - 08 Jun, 2021 - Comments: 0

This paper describes a Deep Data approach to reliability monitoring in advanced electronics, based on degradation as a precursor for failure. By applying machine learning algorithms and analytics to data created by on-chip monitoring IPs (Agents), IC/system health and performance can be continuously monitored, at all stages of the product lifecycle. Realtime degradation analysis of critical par... » read more

Fab Fingerprint For Proactive Yield Management
By Onto Innovation - 08 Jun, 2021 - Comments: 0

The following paper presents a case study describing how to improve yield and fab productivity by implementing a frequent pattern database that utilizes artificial intelligence-based spatial pattern recognition (SPR) and wafer process history. This is important because associating spatial yield issues with process and tools is often performed as a reactive analysis, resulting in increased wafer... » read more

The Next Generation of Testbench Debug Productivity
By Synopsys - 08 Jun, 2021 - Comments: 0

It is widely accepted that verification consumes at least sixty percent of time and resources on most semiconductor development projects. This statistic has been borne out by many industry surveys over the last twenty years. Verification technology has had to evolve to accommodate ever larger and more complex designs. Innovations such as constrained-random simulation and the Universal Verificat... » read more

Orchestrating An Efficient ISO 26262 Fault Campaign
By Siemens EDA - 02 Jun, 2021 - Comments: 0

The primary objective of a fault campaign is to understand whether the safety architecture sufficiently prevents random failures from violating ISO 26262 safety requirements for both commercial and passenger automobiles. To complete fault injection, faults are injected and propagated in the design to validate the functional correctness of the safety mechanisms and to classify each fault. Fault ... » read more

Security Solutions for AI/ML
By Rambus - 02 Jun, 2021 - Comments: 0

AI/ML is increasingly pervasive across all industries driven by a massive wave of digitization. Data, the raw material of AI/ML and Deep Learning algorithms, is available in enormous quantities from all aspects of business operations. AI/ML promises great gains in responsiveness and adaptability in an ever-changing technology landscape, and industries are enthusiastically responding to that app... » read more

Achieving Embedded Design Simplicity With Kria SOMs
By Xilinx - 02 Jun, 2021 - Comments: 0

Xilinx Kria System-on-Modules (SOMs) provide a secure and production-ready multicore Arm processing and FPGA platform, including memories, power management, and your choice of a Yocto or Ubuntu Linux infrastructure to build accelerated AI-enabled applications at the edge. Kria accelerated apps offer an industry-first shortcut that enable both new and experienced Xilinx designers to skip doing a... » read more

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