Chip Industry Technical Paper Roundup: Mar. 5

Analog IMC; timing vulnerabilities in processors; scaling and BEOL on MRAM; ALD; nanoacoustic pass-band filters; electronic noise; cooling with trapped ions; CIM based on subthreshold-FeFET.


New technical papers added to Semiconductor Engineering’s library this week.

Research Organizations
A Precision-Optimized Fixed-Point Near-Memory Digital Processing Unit for Analog In-Memory Computing IBM Research Europe and IIS-ETH Zurich
WhisperFuzz: White-Box Fuzzing for Detecting and Locating Timing Vulnerabilities in Processors IIT Madras, Texas A&M University, and
Technische Universität Darmstadt
Impact of Technology Scaling and Back-End-of-the-Line Technology Solutions on Magnetic Random-Access Memories Georgia Institute of Technology
High throughput multiplexing reactor design for rapid screening of atomic/molecular layer deposition processes University of Washington
Compact and wideband nanoacoustic pass-band filters for future 5G and 6G cellular radios Northeastern University
Electronic Noise Spectroscopy of Quasi-2D van der Waals Antiferromagnetic Semiconductors UCLA
Rapid exchange cooling with trapped ions Georgia Tech Research Institute
Low Power and Temperature-Resilient Compute-In- Memory Based on Subthreshold-FeFET Zhejiang University, University of Notre Dame, Technical University of Munich, Munich Institute of Robotics and Machine Intelligence, and the Laboratory of Collaborative Sensing and Autonomous Unmanned Systems of Zhejiang Province

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