tag: heterogeneous integration

Bumps Vs. Hybrid Bonding For Advanced Packaging
By Mark LaPedus - 23 Jun, 2021 - Comments: 3

Advanced packaging continues to gain steam, but now customers must decide whether to design their next high-end packages using existing interconnect schemes or move to a next-generation, higher-density technology called copper hybrid bonding. The decision is far from simple, and in some cases both technologies may be used. Each technology adds new capabilities in next-generation advanced pac... » read more

Monitoring Performance From Inside A Chip
By Ed Sperling - 01 Jun, 2021 - Comments: 0

Deep data, which is generated inside the chip rather than externally, is becoming more critical at each new process node and in advanced packages. Uzi Baruch, chief strategy officer at proteanTecs, talks with Semiconductor Engineering about using that data to identify potential problems before they result in failures in the field, and why it's essential to monitor these devices throughout their... » read more

The Increasingly Uneven Race To 3nm/2nm
By Mark LaPedus and Ed Sperling - 24 May, 2021 - Comments: 2

Several chipmakers and fabless design houses are racing against each other to develop processes and chips at the next logic nodes in 3nm and 2nm, but putting these technologies into mass production is proving both expensive and difficult. It's also beginning to raise questions about just how quickly those new nodes will be needed and why. Migrating to the next nodes does boost performance an... » read more

Next-Gen Design Challenges
By Ed Sperling - 20 Apr, 2021 - Comments: 0

As more heterogeneous chips and different types of circuitry are designed into one system, that all needs to be simulated, verified and validated before tape-out. Aveek Sarkar, vice president of engineering at Synopsys, talks with Semiconductor Engineering about the intersection of scale complexity and systemic complexity, the rising number of corners, and the reduced margin with which to buffe... » read more

How Heterogeneous ICs Are Reshaping Design Teams
By Ed Sperling - 31 Mar, 2021 - Comments: 1

Experts at the Table: Semiconductor Engineering sat down to discuss the complex interactions developing between different engineering groups as designs become more heterogeneous, with Jean-Marie Brunet, senior director for the Emulation Division at Siemens EDA; Frank Schirrmeister, senior group director for solution marketing at Cadence; Maurizio Griva, R&D Manager at Reply; and Laurent Mai... » read more

Designing 2.5D Systems
By Brian Bailey - 15 Mar, 2021 - Comments: 0

As more designs hit the reticle limit, or suffer from decreasing yield, migrating to 2.5D designs may provide a path forward. But this kind of advanced packaging also comes with some additional challenges. How you adapt and change your design team may be determined by where your focus has been in the past, or what you are trying to achieve. There are business, organizational, and technical c... » read more

The Chip Industry’s Next-Gen Roadmap
By Mark LaPedus - 21 Jan, 2021 - Comments: 1

Todd Younkin, the new president and chief executive of the Semiconductor Research Corp. (SRC), sat down with Semiconductor Engineering to talk about engineering careers, R&D trends and what’s ahead for chip technologies over the next decade. What follows are excerpts of that conversation. SE: As a U.S.-based chip consortium, what is SRC's charter? Younkin: The Semiconductor Research... » read more

A Production-Worthy Fan-Out Solution — ASE FOCoS Chip Last
By ASE - 16 Dec, 2020 - Comments: 0

The 5th Generation (5G) wireless systems popularity will push the package development into a high performance and heterogeneous integration form. For high I/O density and high performance packages, the promising Fan Out Chip on Substrate (FOCoS) provides a solution to match outsourced semiconductor assembly and testing (OSAT) capability. FOCoS is identified the Fan Out (FO) package, which can f... » read more

LDFO SiP For Wearables & IoT With Heterogeneous Integration
By Amkor - 02 Dec, 2020 - Comments: 0

Authors A. Martins*, M. Pinheiro*, A. F. Ferreira*, R. Almeida*, F. Matos*, J. Oliveira*, Eoin O´Toole*, H. M. Santos†, M. C. Monteiro‡, H. Gamboa‡, R. P. Silva* ‡Fraunhofer Portugal AICOS, Porto, Portugal †INESC TEC *AMKOR Technology Portugal, S.A. ABSTRACT The development of Low-Density Fan-Out (LDFO), formerly Wafer Level Fan-Out (WLFO), platforms to encompass the require... » read more

Versal Premium ACAPs: Breakthrough Integration of Networked IP On A Power-Optimized, Adaptable Platform
By Xilinx - 01 Dec, 2020 - Comments: 0

In every market across the world, continuous demand for higher bandwidth metro and core networks scales beyond what today's technologies can support. Data center-centric scientific, enterprise, and consumer applications demand more efficient, higher performance compute that scales beyond what traditional technologies can match. Discrete solutions cannot meet performance, thermal, and bandwidth ... » read more

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