Test Costs Spiking


The cost of test is rising as a percentage of manufacturing costs, fueled by concerns about reliability of advanced-node designs in cars and data centers, as well as extended lifetimes for chips in those and other markets. For decades, test was limited to a flat 2% of total manufacturing cost, a formula developed prior to the turn of the Millennium after chipmakers and foundries saw the traj... » read more

Manufacturing Optimization With Digital Thread


Data is everywhere, and if you know what to do with it, can be tremendously valuable. Huge volumes of data are collected in manufacturing industries across the supply chain, with the help of technologies such as IoT platforms, sensors, and edge devices. However, data is only as good as the value extracted from it, and getting the most out of data is challenging. Because information is often con... » read more

Grading Chips For Longer Lifetimes


Figuring out how to grade chips is becoming much more difficult as these chips are used in applications where they are supposed to last for decades rather than just a couple of years. During manufacturing, semiconductors typically are run through a battery of tests involving performance and power, and then priced accordingly. But that is no longer a straightforward process for several reason... » read more

More Data, More Problems In Automotive


The race toward increasing levels of autonomy is being hampered by competitive concerns over sharing data across the automotive supply chain. Pushing past the initial ADAS levels into full autonomy is expected to take more than a decade, but the infrastructure for those systems, and making sure all assisted and autonomous vehicles work with other vehicles, is under development today. Still, ... » read more

Failure Analysis Becoming Critical To Reliability


Failure analysis is rapidly becoming a complex, costly and increasingly time-consuming must-do task as demand rises for reliability across a growing range of devices used in markets ranging from automotive to 5G. From the beginning, failure analysis has been about finding out what went wrong in semiconductor design and manufacturing. Different approaches, tools and equipment have improved ov... » read more

3 Big Data Mega Trends For 2020


What are the greatest trends and challenges that will define the automotive and semiconductor industries in 2020? Our e-book delves deep into three of these megatrends: Artificial intelligence and machine learning at scale Holistic quality solutions Connected supply chains With automotive and semiconductor manufacturers under mounting pressure to manufacture products of the hig... » read more

Making 3D Structures And Packages More Reliable


The move to smaller vertical structures and complex packaging schemes is straining existing testing approaches, particularly in heterogeneous combinations on a single chip and in multi-die packages. The complexity of these devices has exploded with the slowdown in scaling, as chipmakers turn to architectural solutions and new transistor structures rather than just relying on shrinking featur... » read more

Automakers Changing Tactics On Reliability


Automakers are beginning to rethink how to ensure automotive electronics will remain reliable over their projected lifetimes, focusing their efforts on redundancy, more data-centric architectures and continued testing throughout the life of a vehicle. It is still too early to really know how automotive chips actually will perform over the next 15 to 20 years, especially AI logic developed at... » read more

Week In Review: Manufacturing, Test


Chipmakers A fire broke out this week at a joint NAND flash fab between Western Digital (WD) and Kioxia. Kioxia is the former Toshiba NAND flash unit that was recently spun out by the Japanese company. “On Monday, January 6, (morning, January 7 local time) a small fire occurred at one of our joint venture facilities in Yokkaichi, Japan. Local firefighters quickly extinguished the fire, and w... » read more

Week In Review: IoT, Security, Autos


Internet of Things Sensors that see in the dark, look deep into our faces and hear the impossible, were all part of ams’ CES lineup this week. ams announced that it has designed an advanced spectral ambient light sensor (ALS) for high-end mobile phone cameras. The ALS, called the AS7350, identifies the light source and makes an accurate white balance under low-light and other non-ideal condi... » read more

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