Navigating Reliability Potholes: Early 3D Stress Analysis For Automotive ICs


The rise of 3D integrated circuits (ICs) and heterogeneous packaging is reshaping how automotive ICs fulfill demanding analog and sensor requirements. Whether for radar, lidar, sensor fusion or domain controllers, advanced packaging enables new levels of integration—and performance—in automotive electronics. Yet, as these architectures grow more complex, they also introduce new forms of mec... » read more

Mechanical Stress In Semiconductor Development


With the semiconductor industry moving toward 3D DRAM, 3D logic architectures, and 1000+ layer 3D NAND stacks,1 mechanical failures may become more common. Due to the complexity of these structures, mechanical stress from materials processing has the potential to significantly impact yield. 3D processing techniques (etching, deposition, and related chemistries), as well as material property de... » read more