category: Top Stories

category: Auto, Security & Edge AI

Mostly Upbeat Outlook For Chips
By Brian Bailey - 17 Jan, 2019 - Comments: 1

2019 has started with cautious optimism for the semiconductor industry, despite dark clouds that dot the horizon. Market segments such as cryptocurrencies and virtual reality are not living up to expectations, the market for smart phones appears to be saturated, and DRAM prices are dropping, leading to cut-backs in capital expenditures. EDA companies are talking about sales to China being pu... » read more

Process Variation And Aging
By Ann Mutschler - 17 Jan, 2019 - Comments: 0

Semiconductor Engineering sat down to discuss design reliability and circuit aging with João Geada, chief technologist for the semiconductor business unit at ANSYS; Hany Elhak, product management director, simulation and characterization in the custom IC and PCB group at Cadence; Christoph Sohrmann, advanced physical verification at Fraunhofer EAS; and Naseer Khan, vice president of sales at M... » read more

Designing For Ultra-Low-Power IoT Devices
By Ann Mutschler - 19 Dec, 2018 - Comments: 1

Optimizing designs for power is becoming the top design challenge in battery-driven IoT devices, boxed in by a combination of requirements such as low cost, minimum performance and functionality, as well as the need for at least some of the circuits to be always on. Power optimization is growing even more complicated as AI inferencing moves from the data center to the edge. Even simple... » read more

What Makes A Chip Design Successful Today?
By Brian Bailey - 13 Dec, 2018 - Comments: 0

"Transistors are free" was the rallying cry of the semiconductor industry during the 1990s and early 2000s. That is no longer true. The end of Dennard scaling made the simultaneous use of all the transistors troublesome, but transistors remained effectively unlimited. This led to an era where large amounts of flexibility could be built into a chip. It didn't matter if all of it was being use... » read more

Impacts Of Reliability On Power And Performance
By Ann Mutschler - 13 Dec, 2018 - Comments: 0

Making sure a complex system performs as planned, and providing proper access to memories, requires a series of delicate tradeoffs that often were ignored in the past. But with performance improvements increasingly tied to architectures and microarchitectures, rather than just scaling to the next node, approaches such as determinism and different kinds of caching increasingly are becoming criti... » read more

The Cost Of Accuracy
By Brian Bailey - 13 Dec, 2018 - Comments: 0

How accurate does a system need to be, and what are you willing to pay for that accuracy? There are many sources of inaccuracy throughout the development flow of electronic systems, most of which involve complex tradeoffs. Inaccuracy leaves an impact on your design in ways you are not even aware of, hidden by best practices or guard-banding. EDA tools also inject some inaccuracy. As the i... » read more

How To Improve Analog Design Reuse
By Ann Mutschler - 14 Nov, 2018 - Comments: 0

Digital circuit design is largely automated today, but most analog components still are designed manually. This may change soon. As analog design grows increasingly complex and error-prone, design teams and tool vendors are focusing on how to automate as much of the design of analog circuits as possible. Analog design is notoriously difficult and varied. It can include anything from power ma... » read more

Why Chips Die
By Brian Bailey - 12 Nov, 2018 - Comments: 4

Semiconductor devices contain hundreds of millions of transistors operating at extreme temperatures and in hostile environments, so it should come as no surprise that many of these devices fail to operate as expected or have a finite lifetime. Some devices never make it out of the lab and many others die in the fab. It is hoped that most devices released into products will survive until they be... » read more

Design For Advanced Packaging
By Brian Bailey - 08 Nov, 2018 - Comments: 0

Advanced packaging techniques are viewed as either a replacement for Moore's Law scaling, or a way of augmenting it. But there is a big gap between the extensive work done to prove these devices can be manufactured with sufficient yield and the amount of attention being paid to the demands advanced packaging has on the design and verification flows. Not all advanced packaging places the same... » read more

Taming NBTI To Improve Device Reliability
By Ann Mutschler - 08 Nov, 2018 - Comments: 2

Negative-bias temperature instability is a growing issue at the most advanced process nodes, but it also has proven extremely difficult to tame using conventional approaches. That finally may be starting to change. NBTI is an aging mechanism in field-effect transistors that leads to a change of the characteristic curves of a transistor during operation. The result can be a drift toward unint... » read more

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