category: Top Stories

category: Auto, Security & Edge AI

Executive Insight: Wally Rhines
By Ann Mutschler - 05 May, 2014 - Comments: 1

Semiconductor Engineering sat down with Wally Rhines, chairman and CEO of Mentor Graphics, to discuss what is required for EDA to grow, key areas of opportunity for EDA growth and going against the grain. The interview is part of an ongoing series of in-depth interviews with top executives from all segments of the industry. SE: What keeps you awake at night? Rhines: Actually nothing keeps... » read more

What Are EDA’s Big Three Thinking?
By Ed Sperling - 24 Apr, 2014 - Comments: 4

Over the past six weeks, the CEOs of Cadence, Synopsys and Mentor Graphics—in that order—have delivered top-down visionary messages to their user groups. Semiconductor Engineering had the opportunity to attend all three sessions, and has compiled comments from each on a variety of subjects. In some cases, all the CEOs were in sync. In others, they were not. In still others, it was difficult... » read more

Graphing Toward Standardization
By Brian Bailey - 24 Apr, 2014 - Comments: 0

Graph-based verification has become the hot topic of the day. It commanded a lot of attention at the recent DVCon, promises to fix many of the problems plaguing functional verification, can provide an automated way to perform system-level verification, enables portability of tests between simulation, emulation and prototyping, reduces the wastage created by constrained random test pattern gener... » read more

How To Improve Debug Productivity
By Ann Mutschler - 24 Apr, 2014 - Comments: 0

In the realm of SoC verification world, it often takes a very short amount of time to write the testbench and the code, and the rest of the time — up to 90% — is spent debugging. After all, verification is essentially finding the bugs in a design. Debugging essentially has evolved over the years on the same path and complexity curve as design. Now debugging needs to evolve to keep pace, ... » read more

Efficiency Metrics Get Fuzzy
By Ed Sperling - 24 Apr, 2014 - Comments: 0

Not too long ago chipmakers used to measure transistors per hour and software developers would measure lines of code written per day or per week. Those metrics have fallen by the wayside—and chipmakers are still lamenting that loss. The problem is that nothing has come along to replace the old metrics, and complexity has left many chipmakers scratching their heads about how to build effici... » read more

Extending UVM To Analog
By Ann Mutschler - 24 Apr, 2014 - Comments: 2

As SoC complexity has grown, so too has the need to model the analog/mixed-signal content in a similar way as the digital content to make simulation easier. One way to do this is within the context of the Universal Verification Methodology (UVM). In fact, this can and is being done today with UVM as it stands, according to a number of industry sources. However, there is also growing interest... » read more

Does Formal Have You Covered?
By Brian Bailey - 24 Apr, 2014 - Comments: 1

In part one of this roundtable, the panelists talked about the recent changes that have brought formal to the forefront of verification and discussed the challenges that the UVM have brought to formal. In this segment we start exploring those difficulties in more detail and the progress made with integrated coverage. Participating in the panel were Pete Hardee, director of product management fo... » read more

Cadence Gobbles Up Jasper
By Brian Bailey - 21 Apr, 2014 - Comments: 4

2012 was the year that everyone remembers Synopsys going on an acquisition binge, but 2014 will go down as the year that Cadence Design Systems decided that EDA was worth investing in. Rather than placing investment bets outside of its core competence, Cadence bought Forte in February and now adds Jasper Design Automation to its fold. Jasper started life as Tempus Fugit in 1999 and became Ja... » read more

Big Shift In SoC Verification
By Ed Sperling - 31 Mar, 2014 - Comments: 0

Semiconductor Engineering sat down to discuss software-driven verification with Ken Knowlson, principal engineer at Intel; Mark Olen, product manager for the Design Verification Technology Division of Mentor Graphics; Steve Chappell, senior manager for CAE technology and verification at Synopsys; Frank Schirrmeister, group director for product marketing of the System Development Suite at Cadenc... » read more

New Approaches For Reliability
By Ed Sperling - 28 Mar, 2014 - Comments: 0

The definition of reliability hasn’t budged since the invention of the IC, but how to achieve it is starting to change. In safety-critical systems, as well as in markets such as aerospace, demands for reliability are so rigorous that they often require redundant circuitry—and for good reason. A PanAmSat malfunction in 1998 caused by tin whisker growth wiped out pagers for 45 million use... » read more

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