TaN nanowires for quantum; system-level power integrity verification; DRAM read disturbance; vehicle-in-virtual method for autonomous driving; redox-based ionic devices for HPC; capturing images in a biological camera; 2D materials for flexible electronics; transistors for conformable bioelectronics; mitigating fault attacks; antenna for nanoscale light sources.
New technical papers recently added to Semiconductor Engineering’s library:
| Technical Paper | Research Organizations |
|---|---|
| A Compressed Multivariate Macromodeling Framework for Fast Transient Verification of System-Level Power Delivery Networks | Politecnico di Torino and Intel Corporation |
| RowPress: Amplifying Read Disturbance in Modern DRAM Chips | ETH Zürich |
| Ultra-thin TaN Damascene Nanowire Structures on 300 mm Si Wafers for Quantum Applications | NY CREATES, United States Air Force Research Laboratory and SUNY Polytechnic Institute |
| Vehicle-in-Virtual-Environment (VVE) Method for Autonomous Driving System Development, Evaluation and Demonstration | Ohio State University |
| A Redox-Based Ion-Gating Reservoir, Utilizing Double Reservoir States in Drain and Gate Nonlinear Responses | National Institute for Materials Science (NIMS) and Tokyo University of Science |
| A biological camera that captures and stores images directly into DNA | National University of Singapore |
| Potential of Transition Metal Dichalcogenide Transistors for Flexible Electronics Applications | Advanced Microelectronic Center Aachen (AMICA), RWTH Aachen University, and Bergische Universität Wuppertal |
| Integrated internal ion-gated organic electrochemical transistors for stand-alone conformable bioelectronics | Columbia University and Columbia University Medical Center |
| Fault Attacks on Access Control in Processors: Threat, Formal Analysis and Microarchitectural Mitigation | University of Kaiserslautern-Landau |
| Exciton-assisted electron tunnelling in van der Waals heterostructures | ETH Zürich, The Barcelona Institute of Science and Technology, Swiss Federal Laboratories for Materials Science and Technology, National Institute for Materials Science, University of Basel, and Institució Catalana de Recerca i Estudis Avançats (ICREA) |
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