Concurrent Test

Derek Wu, senior staff applications engineer at Advantest, looks at the need for doing multiple tests at the same time as chip designs become more complex, increasingly heterogeneous, and much more difficult to test at advanced nodes.       __________________________________ See more tech talk videos here. » read more

Tech Talk: Concurrent Test

Dave Armstrong, director of business development at Advantest, discusses the usefulness of concurrent test and describes how to maximize the value of this approach. [youtube vid=UFPxTlB2LWQ] » read more