Beyond The Bottleneck: 3 Breakthroughs In High-Throughput Connector Testing


By Reagan Oliver and Jesse Ko Ensuring the quality of mass-produced electronic connectors without creating a production bottleneck remains a persistent challenge in manufacturing. As demand for speed and reliability increases, innovative testing solutions are emerging to meet this need head-on. This article breaks down three key breakthroughs in modern connector testing technology based on a... » read more

Overcoming Signal Integrity Challenges Of 112G Connections


One of the big challenges with 112G SerDes (and, to a lesser extent, all SerDes) is handling signal integrity issues. In the worst case of a long-reach application, the signal starts at the transmitter on one chip, goes from the chip to the package, across a trace on a printed-circuit board (PCB), through a connector, then a cable or backplane, another connector, another PCB trace, another pack... » read more