Blog Review: Oct. 14


Arm's Hongsup Shin explains a machine learning application that can determine which tests are most likely to find hardware bugs, improving efficiency and reducing the number of tests that need to be run. Synopsys' Pieter van der Wolf and Dmitry Zakharov take a look at the increasing need for low power processors optimized for machine learning tasks as IoT, smart home, and wearable devices pr... » read more

Blog Review: July 8


Cadence's Paul McLellan profiles Alessandra Nardi, recipient of this year's Marie R. Pistilli Women in EDA award, how she entered the industry and her latest work on automotive and a functional safety language. In a video, Mentor's Colin Walls checks out why RISC-V is the hot new fashion in embedded systems development. A Synopsys writer explains why the MACsec security protocol is so imp... » read more

Blog Review: June 24


Cadence's Paul McLellan provides an overview of the new IEEE 1838 standard for manufacturing test of 3D stacked ICs and how it aims to enable testing of multi-die chiplet-based designs. In a video, Mentor's Colin Walls investigates the scope and lifetime of pointers in embedded applications. A Synopsys writer checks out the latest mobile memory standard, JESD209-5A, and the enhancements i... » read more