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Angstrom-Level Measurements With AFMs


Competition is heating up in the atomic force microscopy (AFM) market, where several vendors are shipping new AFM systems that address various metrology challenges in packaging, semiconductors and other fields. AFM, a small but growing field that has been under the radar, involves a standalone system that provides surface measurements on structures down to the angstrom level. (1 angstrom = 0... » read more

Manufacturing Bits: July 28


Nanoscale IR imaging The Nanooptics Group at CIC nanoGUNE has made some major advances in the emerging field of nanoscale infrared microscopy. The group’s technology, called nano-FTIR spectroscopy, is an infrared characterization technique. Infrared (IR) isn’t new. Invisible to the human eye, infrared wavelengths range between 760nm to 1,000nm. For years, infrared inspection/metrology h... » read more