Streamlining Failure Analysis Of Chips

Experts at the Table: Semiconductor Engineering sat down to discuss how increasing complexity in semiconductor and packaging technology is driving shifts in failure analysis methods, with Frank Chen, director of applications and product management at Bruker Nano Surfaces & Metrology; Mike McIntyre, director of product management in the Enterprise Business Unit at Onto Innovation; Kamran Hak... » read more

An Insider’s View Of Verifying Custom RISC-V Processor Cores

By Shubhodeep Roy Choudhury, Valtrix Systems, and Lee Moore, Imperas Software Supporting images courtesy of Bill McSpadden, Seagate Technology This article is derived from a talk at the RISC-V Summit in December 2020 that Bill McSpadden, principal verification engineer at Seagate Technology, gave on the challenges and experiences his team faced in the verification of two custom RISC-V proce... » read more