tag: reliability

The Time Is Now For A Common Model Interface
By Ahmed Ramadan - 28 Feb, 2019 - Comments: 0

By Ahmed Ramadan and Greg Curtis Driven by consumer demand for “cheaper, faster, and better,” the semiconductor industry is continually pushing the migration to smaller process geometries. This continued scaling of complex designs into advanced process nodes is critical for applications ranging from high-performance computing to low-power mobile devices. In the past, products like sma... » read more

The Paradox Of Automotive Electronics
By Ed Sperling - 12 Feb, 2019 - Comments: 6

There is a huge problem brewing in the automotive world. Automakers are demanding quality parts, but they're using methods and strategies developed in the steel age when suppliers were metal benders, not developers of advanced electronics. Automakers are correct in that the quality of electronics is poor. A 2018 report by J.D. Power showed that overall car reliability is improving year over ... » read more

Reliability Becomes The Top Concern In Automotive
By SE Staff - 12 Feb, 2019 - Comments: 4

Reliability is emerging as the top priority across the hottest growth markets for semiconductors, including automotive, industrial and cloud-based computing. But instead of replacing chips every two to four years, some of those devices are expected to survive for up to 20 years, even with higher usage in sometimes extreme environmental conditions. This shift in priorities has broad ramificat... » read more

Variation’s Long Tentacles
By Ed Sperling - 24 Jan, 2019 - Comments: 1

Today, most design engineers don't pay much attention to variation. It's generally considered to be a manufacturing problem. Even within the fab, various job functions are segmented enough that variation in one part of the process, such as the photomask shop, doesn't necessarily come to the attention of the people doing deposition and etch or those polishing the wafers. But increasingly, ... » read more

Boosting Analog Reliability
By Ed Sperling - 17 Jan, 2019 - Comments: 0

Aveek Sarkar, vice president of Synopsys’ Custom Compiler Group, talks about challenges with complex design rules, rigid design methodologies, and the gap between pre-layout and post-layout simulation at finFET nodes. https://youtu.be/JRYlYJ31LLw » read more

Tightening Margins On Heat
By Ed Sperling - 17 Jan, 2019 - Comments: 0

Stephen Crosher, CEO of Moortec, talks with Semiconductor Engineering about the impact of more accurate measurements on power, performance and reliability of designs from 40nm all the way down to 3nm. https://youtu.be/VnX-TiaMVmI » read more

Testing AI Systems
By Ed Sperling - 15 Jan, 2019 - Comments: 0

AI is booming. It's coming to a device near you—maybe even inside of you. And AI will be used to design, manufacture and even ship those devices, regardless of what they are, where they are used, or how they are transported. The big questions now are whether these systems work, for how long—and what do those metrics even mean? An AI system, or AI-enhanced system, is supposed to adapt ove... » read more

Chasing Reliability In Automotive Electronics
By SE Staff - 15 Jan, 2019 - Comments: 0

Assuring reliability in automotive electronics has set off a scramble across the semiconductor supply chain and unearthed a list of issues for which there is insufficient data, a lack of well-defined standards, and inconsistent levels of expertise. Reliable functional safety that spans 18 to 20 years of service in harsh environments, or under constant use with autonomous taxis or trucks, is ... » read more

A Longer Life For LED Power Electronics
By DELTA, a part of FORCE Technology - 10 Dec, 2018 - Comments: 0

One of the greater challenges with LED lighting is the electronic driver’s robustness to normally occurring transients or power surges in the network. Many everyday examples have shown that the active electronics in the light sources find it hard to handle the effects in a use environment, in which incandescent bulbs and lamps with passive electronics have functioned fine for decades. A new p... » read more

Making Sure A Heterogeneous Design Will Work
By Ed Sperling - 03 Dec, 2018 - Comments: 0

An explosion of various types of processors and localized memories on a chip or in a package is making it much more difficult to verify and test these devices, and to sign off with confidence. In addition to timing and clock domain crossing issues, which are becoming much more difficult to deal with in complex chips, some of the new devices are including AI, machine learning or deep learning... » read more

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