Resistive Switching Analysis In Titanium Oxide-Based Memristors Including Surface Scanning Thermal Microscopy


A technical paper titled “Thermal Compact Modeling and Resistive Switching Analysis in Titanium Oxide-Based Memristors” was published by researchers at Universidad de Granada, Leibniz-Institut für innovative Mikroelektronik, Universidad Politécnicade Madrid, University of Twente, King Abdullah University of Science and Technology (KAUST), and Universitat de Barcelona. Abstract: "Resist... » read more