tag: variability

Target: 50% Reduction In Memory Power
By Brian Bailey - 11 Apr, 2019 - Comments: 3

Memory consumes about 50% or more of the area and about 50% of the power of an SoC, and those percentages are likely to increase. The problem is that static random access memory (SRAM) has not scaled in accordance with Moore's Law, and that will not change. In addition, with many devices not chasing the latest node and with power becoming an increasing concern, the industry must find ways to... » read more

Adapt Or Fall Behind: Surviving And Thriving In The Competitive Jungle Of Plant Operations Scheduling And IIoT
By Applied Materials - 16 Aug, 2018 - Comments: 0

Biopharmaceutical manufacturing has required significant technological developments in the area of cell culture, chromatography, and purification. It is no small miracle that every day across the world, millions of liters of cell culture capacity generates life-saving medicines for the patients who need it. The bio-manufacturing process is unique in its need for— Tight regulation of an i... » read more

Beyond Signoff
By Annapoorna Krishnaswamy - 14 Jun, 2018 - Comments: 0

The future of connectivity is very promising - the new era of semiconductors will give rise to transformational products that will enable seamless connectivity with 5G, smarter devices with AI, next generation mobility with autonomous vehicles and immersive experiences with AR and VR. These cutting-edge electronics systems will require the use of advanced sub-16nm SoCs and complex packaging tec... » read more

The Implementation Of Embedded PVT Monitoring Subsystems In Today’s Cutting Edge Technologies
By Moortec - 13 Dec, 2017 - Comments: 0

This new whitepaper from Moortec takes a comprehensive look at the Implementation of Embedded PVT Monitoring Subsystems in Today’s Cutting Edge Technologies and how this can benefit today’s advanced node semiconductor design engineers by improving the performance and reliability of SoC designs. With advances in CMOS technology, and the scaling of transistor channel lengths to nanometer (nm)... » read more

A Call To Action: How 20nm Will Change IC Design
By Various Writers - 21 Feb, 2013 - Comments: 0

The 20nm process node represents a turning point for the electronics industry. While it brings tremendous power, performance and area advantages, it also comes with new challenges in such areas as lithography, variability, and complexity. The good news is that these become manageable challenges with 20nm-aware EDA tools when they are used within end-to-end, integrated design flows based on a �... » read more

Experts At The Table: IC Manufacturing Challenges
By Ed Sperling - 20 Sep, 2012 - Comments: 0

By Mark LaPedus Semiconductor Manufacturing & Design sat down to discuss future manufacturing challenges with Carlos Mazure, chief technical officer at Soitec; Jeff Hebb, vice president of laser product marketing at Ultratech; Markus Wimplinger, corporate technology development and IP director at EV Group; and Girish Dixit, vice president of the customer integration center and process inte... » read more

Dealing With Variability
By Barry Pangrle - 12 Jul, 2012 - Comments: 0

By Barry Pangrle Process, voltage and temperature, a.k.a. PVT, are well known to designers who are working to complete “signoff” for their designs. In order for a design to be production-ready, it’s necessary to ensure that the design is going to yield parts at a sufficiently high percentage for profitability and that it will still operate within the expected variation of the process and... » read more

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