tag: yieldWerx

Challenges In Testing Photonics In Chips
By Ed Sperling - 21 Nov, 2025 - Comments: 0

The semiconductor industry has spent decades improving reliability and consistency by standardizing when and how to test it, how to collect critical data from those tests, and what to do with that data. But electrical test data is very different from silicon photonics, which is being bundled into these SoCs and multi-die assemblies alongside traditional electrical components. Aftkhar Aslam, CEO... » read more

Advanced Packaging Traceability And Root Cause Analysis
By Aftkhar Aslam - 20 Nov, 2025 - Comments: 0

The semiconductor industry is undergoing a profound transformation. What once centered on single-die silicon packaged in QFN or BGA formats has evolved into a landscape of multi-die integration, chiplets, 3D stacking, and photonics coupling. These advanced packaging architectures are redefining design, manufacturing, and test paradigms—enabling new levels of performance, efficiency, and funct... » read more

The Thermal Trap: How Dielectrics Limit Device Performance
By Gregory Haley - 20 Nov, 2025 - Comments: 1

The spread of artificial intelligence is forcing an uncomfortable truth on semiconductor manufacturing. Thin films, which are essential for isolating signals and insulating different components and metal layers, are becoming heat traps as physical dimensions continue to shrink in chips used inside AI data centers. That, in turn, is limiting how fast these chips can process data and increasing t... » read more

Chip Industry Week in Review
By The SE Staff - 14 Nov, 2025 - Comments: 0

Samsung reportedly is hiking memory chip prices by 30% to 60% due to high demand from AI data centers and constrained supplies. Those shortages are causing ripples elsewhere. SMIC, China's largest foundry, said its customers are holding back orders for other types of semiconductor due to concerns about memory supplies. Meanwhile, interest in photonics and power semiconductors is picking up, ... » read more

Chip Industry Week in Review
By The SE Staff - 31 Oct, 2025 - Comments: 0

San Francisco-based Substrate raised more than $100 million to build a vertically integrated foundry that uses particle accelerators to produce "the world's brightest beams, enabling a new method of advanced X-ray lithography." The company claims its technology is comparable to ASML's high NA EUV, and notes it can extend well beyond 2nm. ASML has not publicly commented. The Nexperia chip sho... » read more

Ensuring Reliability Becomes Harder In Multi-Die Assemblies
By Gregory Haley - 29 Oct, 2025 - Comments: 0

Multi-die assemblies are bringing together a variety of materials and processes with distinctly different physical properties, creating significant challenges in manufacturing and packaging that can impact yield at time zero and reliability in the field. What passes electrical screening at the end of the line may look good on paper, but these devices can still fail once exposed to rapid and ... » read more

How Photonics And Handheld Ultrasounds Are Transforming Medical Imaging
By M. Rameez Arif - 27 Oct, 2025 - Comments: 0

Medical imaging has always been a race against time: delivering accurate diagnosis to patients with the speed modern healthcare demands. Traditionally, that meant large, immobile ultrasound machines tucked away in radiology departments, often forcing patients to wait days or weeks for the imaging needed to move forward with treatment. But in recent years, the industry has been moving toward som... » read more

Using AI/ML To Find And Correlate IC Test Data
By Ed Sperling - 15 Oct, 2025 - Comments: 0

What causes low yield in wafers? Usually it's due to design or process changes, but sometimes yield issues occur even if there haven't been any changes from one manufacturing lot to the next. Finding the cause requires some sleuthing, and the best approach for pinpointing problems is to mine design, process, and manufacturing data, and to correlate that data by date and time, by which equipment... » read more

New Frontiers In Fault Detection And Classification
By Laura Peters - 14 Oct, 2025 - Comments: 0

IC manufacturers are increasingly relying on intelligent data processing to prevent downtime, improve yields, and reduce scrap. They are integrating that with fault detection and classification (FDC) to trace faults to their cause. Today’s FDC systems feature better sensors, variability control, and both predictive and prescriptive modeling. In the future, FDC will enable real-time decisio... » read more

Metrology’s Growing Role In Reducing False Defects
By Gregory Haley - 14 Oct, 2025 - Comments: 0

When a good die fails test and gets scrapped, often no one notices, because false failures look identical to real ones. Yet across the industry, these phantom defects are quietly eroding yield, inflating test costs, and masking the true health of manufacturing processes. At advanced nodes and in heterogeneous packaging, where margins are already razor-thin, even minor variations in contact r... » read more

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