IoT Edge Server Selection Criteria
By Adesto Technologies - 10 Jun, 2020 - Comments: 0

There are many factors to consider when choosing the right edge server solution. Discover the power of a next-generation IoT edge server platform and find out how it can easily adapt to new protocols and systems. Click here to continue reading. » read more

Best Full-Flow PPA
By Cadence - 10 Jun, 2020 - Comments: 0

In the past few years, Cadence revolutionized the way digital designers could solve their design challenges by revamping the entire digital tool suite with key enhancements such as integrated engines, massively parallel processing, and early signoff optimization, all delivering faster turnaround time and best-in-class power, performance, and area (PPA) optimization. In the era of FinFETs and ad... » read more

Liability And Reliability
By Ed Sperling - 09 Jun, 2020 - Comments: 0

As systems vendors accelerate the development of their own architectures, semiconductor companies across the supply chain are getting a seat at the table for architecting the engines in those systems. Rather than competing for a socket, they are directly involved in strategizing the optimal solution that can make a systems vendor or OEM more competitive or far more efficient. That gives the dev... » read more

Making Silicon Photonics Chips More Reliable
By Ed Sperling - 09 Jun, 2020 - Comments: 0

Silicon photonics has the ability to dramatically improve on-die and chip-to-chip communication within a package at extremely low power, but ensuring that signal integrity remains consistent over time isn't so simple. While this technology has been used commercially for at least the past decade, it never has achieved mainstream status. That's mostly due to the fact that Moore's Law scaling h... » read more

Using Fab Sensors To Reduce Auto Defects
By Anne Meixner - 09 Jun, 2020 - Comments: 0

The semiconductor manufacturing ecosystem has begun collaborating on ways to effectively use wafer data to meet the stringent quality and reliability requirements for automotive ICs. Silicon manufacturing companies are now leveraging equipment and inspection monitors to proactively identify impactful defects prior to electrical test. Using machine learning techniques, they combine the monitor ... » read more

Semiconductor Professionals On Working From Home
By Marie Ryan - 09 Jun, 2020 - Comments: 0

With most of the world still in lockdown, we thought we’d find out how different people in the semiconductor industry are dealing with the coronavirus. Carl Moore, Yield Management Specialist, yieldHUB How has Covid-19 affected your work life? Much of my work is remote, but Covid-19 affects in-person interactions with customers, which is always important. Video conferencing is critical in ... » read more

Challenges In Making Better Medical Sensors
By SE Staff - 09 Jun, 2020 - Comments: 0

Now that COVID-19 pandemic has desensitized us to telemedicine and more at-home health monitoring, the way we receive health care probably has changed for good. The no-touch thermometer and our personal pulse oximeter are not just coveted gadgets now. They have true clinical use in what may become a “point-of-use” system. Point of use means we don’t have to go to the clinic to get screene... » read more

Probe Expertise For Cryogenic Devices
By Thomas Funke - 09 Jun, 2020 - Comments: 0

The promise of quantum computing to solve complex problems far beyond today’s supercomputer capabilities, plus the emergence of high performance image sensors for security, military, and health care use, and other emerging applications are driving the need for test and measurement tools that can operate in extreme low temperatures (below about -150°C down to a few degrees above absolute zero... » read more

DAC 2020: Virtual And Different
By Ed Sperling - 08 Jun, 2020 - Comments: 0

Zhuo Li, group director at Cadence, and Harry Foster, chief scientist at Mentor, a Siemens Business, talk about the changes in content for this year's Design Automation Conference. » read more

Manufacturing Bits: June 8
By Mark LaPedus - 08 Jun, 2020 - Comments: 0

Maskless EUV lithography At this week’s 2020 EUVL Workshop, KJ Innovation will present more details about its efforts to develop a maskless extreme ultraviolet (EUV) lithography technology. Still in R&D, KJ Innovation’s maskless EUV technology involves a high-numerical aperture (high-NA) system with 2 million individual write beams. The 0.55 NA technology is targeted for direct-write l... » read more

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