Rowhammer Vulnerability Of A HBM2 DRAM Chip

A new technical paper titled "An Experimental Analysis of RowHammer in HBM2 DRAM Chips" was published by researchers at ETH Zurich and American University of Beirut. Abstract: "RowHammer (RH) is a significant and worsening security, safety, and reliability issue of modern DRAM chips that can be exploited to break memory isolation. Therefore, it is important to understand real DRAM chips' ... » read more