tag: AI

(R)evolution of the 56th Design Automation Conference Technical Program
By Harry Foster - 01 May, 2019 - Comments: 0

The Design Automation Conference (DAC), which was founded in 1964, is the longest running and largest conference focused on the design and automation of electronic circuits and systems. And 2019 was a record year in terms of research paper submissions and accepted papers. In fact, this year DAC experienced an impressive 18 percent increase in submissions, as shown in Figure 1. Figure 1: DA... » read more

Focus Shifting From 2.5D To Fan-Outs For Lower Cost
By Ed Sperling - 29 Apr, 2019 - Comments: 0

Semiconductor Engineering sat down to discuss advanced packaging with Calvin Cheung, vice president of engineering at ASE; Walter Ng, vice president of business management at UMC; Ajay Lalwani, vice president of global manufacturing operations at eSilicon; Vic Kulkarni, vice president and chief strategist in the office of the CTO at ANSYS; and Tien Shiah, senior manager for memory at Samsung. W... » read more

Rushing To The Edge
By Ed Sperling - 25 Apr, 2019 - Comments: 0

Virtually every major tech company has an "edge" marketing presentation these days, and some even have products they are calling edge devices. But the reality is that today no one is quite sure how to define the edge or what it will become, and any attempts to pigeon-hole it are premature. What is becoming clear is the edge is not simply an extension of the Internet of Things. It is the resu... » read more

Where Are We On The Road To Artificial Intelligence In Chip Design?
By Thomas Andersen - 25 Apr, 2019 - Comments: 0

It’s hard to find an article today that doesn’t talk about how Artificial Intelligence is going to solve every possible problem in the world. From self-driving cars, to robots running an entire hotel (in Japan), to voice assistants answering your every question, it appears that every problem can be solved with AI. As so often in life, the true answer is: it depends. It depends on the nature... » read more

Automotive, AI Drive Big Changes In Test
By Ann Mutschler - 25 Apr, 2019 - Comments: 0

Design for test is becoming enormously more challenging at advanced nodes and in increasingly heterogeneous designs, where there may be dozens of different processing elements and memories. Historically, test was considered a necessary but rather mundane task. Much has changed over the past year or so. As systemic complexity rises, and as the role of ICs in safety-critical markets continues ... » read more

Verification At 7/5nm
By Ed Sperling - 25 Apr, 2019 - Comments: 0

Christen Decoin, senior director of business development at Synopsys, talks about what’s missing in verification, how is that affected by complex chips such as 7nm SoCs or AI chips, and why more steps need to be done concurrently. https://youtu.be/bz6KyJh67sI » read more

Redefining Expectations for Test
By Synopsys - 24 Apr, 2019 - Comments: 0

New and rapidly expanding applications, such as artificial intelligence and automotive, are increasing in design size and complexity. These evolving market segments require unprecedented levels of quality and long-term reliability, which has created a fundamental shift in both the importance and need for integration of advanced semiconductor test. Synopsys unveiled a new family of test products... » read more

Safety-Critical Coverage
By Ed Sperling - 24 Apr, 2019 - Comments: 0

Dave Landoll, solutions architect at OneSpin Solutions, discusses verification in safety-critical designs, why it’s more of a challenge in automotive than in avionics, and why verification of these systems includes what the system should not be doing as well as what it should be doing. https://youtu.be/Ze3WwEARfx0 » read more

System Bits: April 23
By Jeff Dorsch - 23 Apr, 2019 - Comments: 0

AI tool can clean up dirty data Researchers at the University of Waterloo, collaborating with colleagues at the University of Wisconsin and Stanford University, came up with HoloClean, an artificial intelligence tool to comb through dirty data and to detect information errors. “More and more machines are making decisions for us, so all our lives are touched by dirty data daily,” said Ih... » read more

Week in Review: IoT, Security, Auto
By Jeff Dorsch - 19 Apr, 2019 - Comments: 0

Internet of Things Combining artificial intelligence with unmanned aerial vehicles could provide a quicker and safer alternative to inspecting roadways for cracks, potholes, and other damage, according to a paper posted on arvix.org. “[M]anual visual inspection [is] not only tedious, time-consuming, and costly, but also dangerous for the personnel. Furthermore, the detection results are alwa... » read more

← Older posts Newer posts →

  • Sponsors

About

Navigation

Connect With Us

Copyright ©2013-2026 SMG   |  Terms of Service  |  Privacy Policy