LLM-driven, Formal Verification-Assisted Framework For Functional-Safety-Oriented Fault Criticality Assessment (ASU, TI)


Researchers from Arizona State University and Texas Instruments India published a technical paper titled “SafeGen: LLM-Driven Assertion Generation and Fault Criticality Evaluation for Functional Safety.” Abstract Excerpt: “This paper presents SafeGen, an LLM-driven, formal-verification-assisted framework for functional-safety-oriented fault criticality assessment.” The paper also ... » read more

Leveraging Automotive Chip Design Techniques For Space-Borne Applications


Space-borne electronics must operate in an unforgiving environment with harsh conditions and little opportunity to repair failing components. A combination of functionally safe design, RHBD, and robust IP is required. Fortunately, automotive applications share many of the same challenges, and techniques to address these challenges are well established and proven. This white paper surveys the ma... » read more