中文 English

X-ray Detects Hidden Failure Modes


Functional testing and visual examination using stereo microscopy are today's 'standard' quality control techniques for characterising yield and workmanship-related issues in IC fabrication and electronics assembly. Currently used test methodologies—such as IPC-TM-650—rely heavily on visual examination. The visual detection of defects can still be difficult, as samples need to be inspected ... » read more

Home Automation IoT Company Cuts ASIC Testing Costs


digitalSTROM develops smart home automation solutions providing users with superior comfort and a whole new style of living. Based on proprietary ASIC and software, digitalSTROM’s solutions connect electrical household appliances through existing power lines and enable an intelligent home via light switches, free speaking using Amazon Echo, and other apps. Challenges At the heart of digit... » read more

Failure Analysis of a Product—Not Only a Component


Classic failure analysis (FA) technique generally deals with a single failed component in a complete product to detect the root cause of failure. This approach is inexpensive and less time-consuming. However, this may end up with a wrong interpretation of the product failure or overlooking the synergetic effect of different components related to the failure. This article is about a product on ... » read more