Observability Is A Missing Layer In AI-Era Chiplet Design


Key Takeaways: In chiplet-based architectures, observability must be designed as a fabric-aligned, cross-die telemetry plane so architects can correlate traffic, latency, congestion, and fault behavior across package boundaries without losing system context. AI can extract value from high-volume silicon telemetry only when the architecture provides consistent instrumentation, near-senso... » read more

Designing Chips That Can Explain Themselves


Key Takeaways: On-die telemetry gives architects a path to replace worst-case design margin with measured silicon behavior, improving PPA without compromising resilience. As monitor density and control-loop speed increase, observability must be architected hierarchically across local hardware response, on-die processing, and fleet-level learning. The real payoff is architectural: str... » read more

Observability Is Essential For Modern Silicon


Experts At The Table: In-silicon observability — also known as on-die or on-chip visibility — is becoming increasingly important for managing the performance, reliability, and security of today’s high-performance systems. Semiconductor Engineering sat down to discuss this with Andy Nightingale, vice president of product management and marketing at Arteris; Nandan Nayampally, chief commerc... » read more