A Test Generation Procedure Targeting Subcircuits With High Susceptibilities To Aging (Purdue University)


A technical paper titled "Test Generation for Subcircuits with High Functional Switching Activities" was published by Irith Pomeranz at Purdue University. Abstract "Chip aging results in defects that are initially likely to appear as delay faults. The susceptibility of a delay fault to aging can be assessed based on the layout or the functional workload at the fault site. The key contribu... » read more

Functional Compaction for Functional Test Sequences (Purdue University, I. Pomeranz)


A new technical paper titled "Functional Compaction for Functional Test Sequences" was published by IEEE Fellow Irith Pomeranz at Purdue University. Abstract: "The occurrence of silent data corruption because of hardware defects in large scale data centers points to the advantages of applying functional test sequences to detect hardware defects that escape scan-based tests. When using funct... » read more