Astronics Test Systems And Tabor Electronics End Obsolescence For NAVAIR

Obsolescence. This is not a favorite word for most end users. Flexibility, options, extended product life – those words bring relief to the testing environments of end users. Yet, nonetheless, obsolescence is a factor that must be faced within the testing industry. When the US Naval Air Systems Command (NAVAIR) faced obsolescence with a major Test & Measurement OEM, they turned to Astr... » read more

Logic Analyzers Never Die

Logic analyzers, long a mainstay of chip design, are finding new demand for IoT devices—and frequently in different forms than in the past. Once associated with big, bulky benchtop instruments, this technology has evolved significantly over the past 40 years. In some cases it has been moved into software, where the measurement results are more likely to be viewed upon a laptop screen or a ... » read more

The Abstraction of Test

By Ann Steffora Mutschler By now, semiconductor design abstraction is old hat to many engineers, but mention the term “semiconductor test abstraction” and expect a blank stare in return. Design complexity, enormous design size, and short market windows have put tremendous pressure on test to occur earlier rather than later. Even at the RTL level, where hardware test typically has not ... » read more