End-to-End Yield Management for Compound Semiconductors Manufacturing


Abstract: Progress in compound semiconductors is hindered by the high level of defectivity of the initial material. Here we take Silicon Carbide manufacturing technology as an example and provide an overview of manufacturing analytics tools and methodologies used to drive yield ramp and capacity expansion. We focus on 2 examples of site-to-site handoff: substrates handoff to IC front-end fab or... » read more

Cutting IC Manufacturing Costs By Combining Data


Experts at the Table: Semiconductor Engineering sat down to discuss the benefits of incorporating financial data into fab floor decision-making, including what kind of cost data is most useful, with Dieter Rathei, CEO of DR Yield; Jon Holt, senior director of product management at PDF Solutions, Alex Burlak, vice president of advanced analytics and test at proteanTecs; and Dirk de Vries, techni... » read more