MFMIS FeTFETs For Energy-Efficient, Scalable CIM Hardware Accelerators (Seoul National University)


A new technical titled "Impact of Random Phase Distribution on Ferroelectric Tunnel Field-Effect Transistors With Mitigation Strategies for Compute-in-Memory Applications" was published by researchers at Seoul National University. Abstract "This work presents, for the first time, an investigation of the impact of random phase distribution on ferroelectric (FE) tunnel field-effect transist... » read more