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Adaptive NN-Based Root Cause Analysis in Volume Diagnosis for Yield Improvement


Abstract "Root Cause Analysis (RCA) is a critical technology for yield improvement in integrated circuit manufacture. Traditional RCA prefers unsupervised algorithms such as Expectation Maximization based on Bayesian models. However, these methods are severely limited by the weak predictive capability of statistical models and can’t effectively transfer the yield learning experience from old... » read more

Using 5nm Chips And Advanced Packages In Cars


Semiconductor Engineering sat down to discuss the impact of advanced node chips and advanced packaging on automotive reliability with Jay Rathert, senior director of strategic collaborations at KLA; Dennis Ciplickas, vice president of advanced solutions at PDF Solutions; Uzi Baruch, vice president and general manager of the automotive business unit at OptimalPlus; Gal Carmel, general manager of... » read more

Revealing DRAM Operating GuardBands through Workload-Aware Error Predictive Modeling


Abstract Abstract—Improving the energy efficiency of DRAMs becomes very challenging due to the growing demand for storage capacity and failures induced by the manufacturing process. To protect against failures, vendors adopt conservative margins in the refresh period and supply voltage. Previously, it was shown that these margins are too pessimistic and will become impractical due to high ... » read more

AI Warnings For Safer Driving


You’re driving to work, the same route you take every day. But this time, a storm passes over: you’re suddenly faced with heavy rain and reduced visibility. All of a sudden, the “accident score” meter on your car’s dashboard moves into the red. You ease off the gas, move out of the passing lane and your score drops down to amber—you can’t get it into the green due to the advers... » read more

Verifying AI, Machine Learning


[getperson id="11306" comment="Raik Brinkmann"], president and CEO of [getentity id="22395" e_name="OneSpin Solutions"], sat down to talk about artificial intelligence, machine learning, and neuromorphic chips. What follows are excerpts of that conversation. SE: What's changing in [getkc id="305" kc_name="machine learning"]? Brinkmann: There’s a real push toward computing at the edge. ... » read more