tag: proteanTecs

Minimum Energy Per Query
By Brian Bailey - 12 Feb, 2026 - Comments: 1

Key Takeaways Extracting heat from a chip faster is a short-term fix to a bigger problem. The longer-term challenge is how to reduce the amount of energy used per query. Data movement, guardbanding, and software inefficiency are key targets for the future. Heat is a serious problem within AI chips, and it is limiting how much processing can be done. The solution is either to... » read more

Resistance In Advanced Packages Is Now A System-Level Problem
By Gregory Haley - 10 Feb, 2026 - Comments: 0

Key Takeaways Kelvin measurement, which has been in use for decades, is no longer sufficient for addressing resistance in complex chips. The problem is that resistance is no longer concentrated in transistors, and where it does show up isn't always consistent or obvious. Traditional pass/fail approaches need to be replaced by more granular and flexible analytics and methodologies. ... » read more

Chiplets Add More Inspection And Test Steps
By Anne Meixner - 10 Feb, 2026 - Comments: 0

Key Takeaways Ensuring the reliability of multi-die assemblies requires a variety of approaches to detect subsurface defects. Bonds and interconnects are especially problematic and require more inspection insertions. Ensuring reliability requires connecting fragmented data that is often siloed. The shift to multi-die assemblies is forcing changes in how chips are tested and ... » read more

Why Move To 2nm?
By Ed Sperling - 04 Feb, 2026 - Comments: 0

Key Takeaways: Scaling digital logic still provides significant benefits, especially lower power. Multi-die assemblies will be the predominant approach, and most of the circuitry will not be 2nm or below. While these systems are inherently more flexible, the number and complexity of tradeoffs required for optimizing PPA/C are increasing. The rollout of 2nm process nodes and ... » read more

Secure Data Sharing Becoming Critical For Chip Manufacturing
By Laura Peters - 13 Jan, 2026 - Comments: 0

Semiconductor companies increasingly need to share data to solve problems faster, boost yield, and trace the root cause of failed devices. But to make that work, companies need assurances that their data will be secure, free from data leaks that could result in the loss of valuable IP. Data sharing is becoming critical at leading device nodes, where process variability is starting to consume... » read more

Annual Global IC Fabs And Facilities Report
By Liz Allan - 07 Jan, 2026 - Comments: 0

Semiconductor companies announced a significant number of facilities in 2025 as global onshoring efforts continued across manufacturing, materials, packaging, design, and R&D. Investments came from both industry and government sources. Organizations worked together to solve current technology challenges, including soaring demand for AI chips and advanced memory, as well as complex applic... » read more

2025 – A Year Of Change And Anticipation
By Brian Bailey - 23 Dec, 2025 - Comments: 0

2025 has certainly been a year of unexpected changes. These had a significant impact on the semiconductor industry and everything that supports it. Not all the changes have been bad, but flexibility has been a requirement for continued success or to make the most of an opportunity provided. Some industries, such as aerospace and defense, are seeing a significant boost around the world. Data ... » read more

Limited by Power
By Brian Bailey - 11 Dec, 2025 - Comments: 0

AI is seen as a massive computation problem, but that is not the case, at least with the way that the problem is structured today. It is a data movement problem. This not only limits performance but represents most of the energy consumption. In addition, the industry spends most of its time and effort making small improvements that optimize aspects of the existing architecture, when what is ... » read more

Adaptive Test Gaining Ground For HPC And AI Chips
By Gregory Haley - 09 Dec, 2025 - Comments: 0

Adaptive test is starting to gain traction for high-performance computing and AI chips as test programs that rely on static limits and fixed test sequences reach their practical limits. The growing complexity of multi-die assemblies and power delivery, along with increased stresses, are forcing a shift toward real-time, data-driven optimization at the test cell. “It’s the same old pro... » read more

Resilient And Optimized GenAI Systems
By Ziv Paz - 09 Dec, 2025 - Comments: 1

AI and data center systems are being pushed to their limits, with soaring complexity, nonstop inference workloads, and rising energy demands. Addressing these pressures requires more than incremental improvements, it calls for collaboration across the ecosystem. That’s why proteanTecs has joined forces with Arm, bringing our real-time monitoring technology into Arm’s Neoverse Compute Subsys... » read more

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