tag: Siemens EDA

How Advanced Packaging Is Reshaping Inspection
By Gregory Haley - 10 Jul, 2025 - Comments: 0

As semiconductor devices continue advancing into more sophisticated packaging schemes, traditional optical inspection technologies are brushing up against physical and computational boundaries. The growing reliance on 2.5D and 3D integration, hybrid bonding, and wafer-level processes has made it much harder to detect defects consistently and early enough to protect yields. While optical insp... » read more

Using High-Quality Deterministic Patterns For In-System/In-Field Testing
By Siemens EDA - 10 Jul, 2025 - Comments: 0

Logic BIST (LBIST) is a well-stablished traditional solution for meeting automotive testing standards. However, using pseudo-random LBIST patterns can be challenging when trying to achieve high-quality testing due to the increased complexity of designs. The growing amount of electronic content, along with the shift toward fully autonomous vehicles, demands stringent testing requirements. In-... » read more

AI Pushes High-End Mobile From SoCs To Multi-Die
By Liz Allan - 08 Jul, 2025 - Comments: 0

Advanced packaging is becoming a key differentiator for the high end of the mobile phone market, enabling higher performance, more flexibility, and faster time to market than systems on chip. Monolithic SoCs likely will remain the technology of choice for low-end and midrange mobile devices because of their form factor, proven record, and lower cost. But multi-die assemblies provide more fle... » read more

3D-IC Stress Analysis
By Shetha Nolke - 08 Jul, 2025 - Comments: 0

The semiconductor industry is undergoing a transformation as 3D integrated circuits (ICs) and heterogeneous packaging become mainstream. With these advances comes the promise of higher functional density, a smaller footprint and enhanced system performance. However, these same innovations introduce new mechanical stressors within complex assemblies, posing novel reliability risks across the dev... » read more

AI: A New Tool For Hackers, And For Preventing Attacks
By Ann Mutschler - 08 Jul, 2025 - Comments: 0

Semiconductor Engineering sat down to discuss hardware security challenges, including new threat models from AI-based attacks, with Nicole Fern, principal security analyst at Keysight; Serge Leef, AI-For-Silicon strategist at Microsoft; Scott Best, senior director for silicon security products at Rambus; Lee Harrison, director of Tessent Automotive IC Solutions at Siemens EDA; Mohit Arora, seni... » read more

Rethinking Scan Chains In Semiconductor Test
By Ed Sperling - 02 Jul, 2025 - Comments: 0

An explosion in design complexity, fueled by increased transistor density and fundamental shifts in chip architectures, are beginning to overwhelm traditional approaches to test. Defects can show up in the clock trees that drive scan chains, and even inside blocks of scan cells, which may number in the millions. Jayant D'Souza, technical product director for yield learning products in Siemens E... » read more

Blog Review: July 2
By Jesse Allen - 02 Jul, 2025 - Comments: 0

Synopsys’ Shankar Krishnamoorthy chats with industry experts about how the combination of AI and software-defined systems is driving a re-evaluation of engineering workflows and why chip, software, and system development must evolve in unison. Siemens’ Jake Wiltgen considers the rapidly evolving and growing challenge of performing DFT verification as designs scale, with complex hierarchi... » read more

Rethinking Chip Debug
By Priyank Jain - 30 Jun, 2025 - Comments: 0

By Priyank Jain and James Paris The semiconductor industry has spent decades mastering the art of integrated circuit physical verification. But as system-on-chip (SoC) designs push the boundaries of complexity—with more transistors, greater integration and larger silicon areas—the established debug strategies are breaking under the weight of scale. Today’s advanced chips can generate a... » read more

Chip Industry Week in Review
By The SE Staff - 27 Jun, 2025 - Comments: 0

AI featured big at this week's Design Automation Conference (DAC) in San Francisco. Dozens of companies featured AI-related tools (see product section below), as well as significant improvements to existing tools and some entirely new approaches for designing chips. Among the highlights: Siemens unveiled an AI-enhanced toolset for the EDA design flow that enables customers to integrate the... » read more

Mixed Messages Complicate Mixed-Signal
By Brian Bailey - 26 Jun, 2025 - Comments: 0

Several years ago, analog and mixed signal (AMS) content hit a wall. Its contribution to first-time chip failure doubled, and there is no evidence that anything has improved dramatically since then. Some see that the problem is likely to get worse due to issues associated with advanced nodes, while others see hope for improvement coming from AI or chiplets. Fig. 1: Cause of ASIC respins. S... » read more

← Older posts Newer posts →

  • Sponsors

About

Navigation

Connect With Us

Copyright ©2013-2026 SMG   |  Terms of Service  |  Privacy Policy