Streamlining Functional Verification For Multi-Die And Chiplet Designs


An Opportunity and a Challenge The manufacturing aspects of multi-die/multi-chiplet designs are often highlighted, but what about verification? Functional correctness and performance of inter-die connections via a standard interface, such as UCIe or a custom inter-die interface, are not guaranteed to meet all system requirements. These interfaces must be verified comprehensively, ensuring co... » read more