中文 English

Improving Test Pattern Compression With Tessent VersaPoint Test Point Technology


Mission-critical applications within markets such as transportation and medical devices require higher overall manufacturing test quality, but that often means more test patterns, data volume, and longer test times. Embedded test compression helps, but using VersaPoint test point technology results in 46X compression ration over what is possible with Tessent TestKompress alone. To read more,... » read more

It’s All About Staying Ahead Of The Test Challenges Curve


Since the early days when semiconductor devices contained a mere handful of gates, the manufacturing test world has been focused on how to detect the greatest number of potential defects in the shortest amount of time. This fundamental goal has not changed over the years and continues at 5nm and beyond. What has dramatically changed over the years, however, is the variety of techniques used ... » read more