Primary, Anonymous, or What?
By Siemens EDA - 09 Jun, 2021 - Comments: 0

Top level primary I/Os remain mysterious in the verification world, specifically when you consider UPF-based low power designs. In real silicon, they are usually driven by off-chip supplies; however, verification complications are multifold for RTL and gate level simulations of them. This paper studies the “simulation-impacting” features of design top IOs and the effect of each feature on v... » read more

Accelerate Adoption Of High-Speed, Low-Latency, Cache-Coherent Standards Using Formal Verification
By Cadence - 09 Jun, 2021 - Comments: 0

We continue to see huge growth in data and compute demand, fueled by increased global data traffic with the 5G rollout, the prevalence of streaming services, and expanded artificial intelligence and machine learning (AI/ML) applications. Several new industry-standard specifications have emerged in recent years to define the protocols of the underlying electronic components and IP building block... » read more

Precision: A Case Study For Success
By Rob van Blommestein - 09 Jun, 2021 - Comments: 0

Recently, I was watching a documentary on the NASA Perseverance mission to Mars. I’ve always been fascinated by space travel and the engineering efforts to make it happen. We’ve all heard that the landing for this trip to Mars was the most precise in history, but what the documentary brought to light is the precision involved in each and every aspect of the Perseverance Rover design and dev... » read more

Data Center Evolution: Accelerating Computing With PCI Express 5.0
By Rambus - 09 Jun, 2021 - Comments: 0

The PCI Express (PCIe) interface is the critical backbone that moves data at high bandwidth between various compute nodes such as CPUs, GPUs, FPGAs, and workload-specific accelerators. The rise of cloud-based computing and hyperscale data centers, along with high-bandwidth applications like artificial intelligence (AI) and machine learning (ML), have pushed PCIe 4 to its limits. In this white p... » read more

How To Build A Virtual Electromagnetic Test Environment For Aerospace And Automotive Platforms
By Ansys - 09 Jun, 2021 - Comments: 0

To protect the electromagnetic compatibility (EMC) of complex systems like aircraft and automobiles, you need a full electromagnetic (EM) model. A virtual test environment allows you to assess a design and ensure system-level compatibility before physical testing. This process has been proven to save more than $1 million compared to an approach based solely on testing. Learn how to build a v... » read more

Blog Review: Jun 9
By Jesse Allen - 09 Jun, 2021 - Comments: 0

Arm's Partha Maji introduces a collaboration with the University of Cambridge to advance Bayesian statistics and probabilistic machine learning, which could play a vital role in safety-critical AI applications. Siemens' Thomas Dewey looks at a way to improve autonomous driving capabilities by enabling vehicles to train on past hazardous situations to provide and early warning for when they m... » read more

A Revolution For Power Conversion Systems — CoolSiC MOSFET
By Infineon - 09 Jun, 2021 - Comments: 0

Silicon carbide (SiC) transistors are increasingly used in power converters, placing high demands on the size, weight and/or efficiency. The outstanding material properties of SiC enable the design of fastswitching unipolar devices as opposed to bipolar IGBT devices. Thus, solutions which have been up to now possible in the low-voltage world only (< 600 V) are now possible at higher voltages... » read more

There’s More To Machine Learning Than CNNs
By Bryon Moyer - 09 Jun, 2021 - Comments: 1

Neural networks – and convolutional neural networks (CNNs) in particular – have received an abundance of attention over the last few years, but they're not the only useful machine-learning structures. There are numerous other ways for machines to learn how to solve problems, and there is room for alternative machine-learning structures. “Neural networks can do all this really comple... » read more

Failure Mechanism Detection Algorithm With MOSFET Body Diode
By Fraunhofer IIS/EAS - 09 Jun, 2021 - Comments: 0

Autonomous driving is playing a big role in the automotive industry and defines the future of mobility on a big scale. However, autonomous driving faces several challenges, such as the performance of artificial intelligence and hardware reliability. To ensure safe functionality, the reliability of the electronic components plays an essential role and must be taken into consideration. One aspect... » read more

3 Technologies That Will Challenge Test
By Ed Sperling - 08 Jun, 2021 - Comments: 0

As chips are deployed in more complex systems and with new technologies, it's not clear exactly what chipmakers and systems vendors will be testing. The standard tests for voltage, temperature and electrical throughput still will be needed, of course. But that won't be sufficient to ensure that sensor fusion, machine learning, or millimeter wave 5/6G will be functioning properly. Each of tho... » read more

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