category: Top Stories

category: Auto, Security & Edge AI

The Wild West Of Automotive
By Brian Bailey - 09 Apr, 2015 - Comments: 0

Automotive is considered one of the great new markets for EDA and IP. Electronic complexity is increasing rapidly, product update cycles are decreasing, and new standards mean that many of the old ways of doing development are no longer possible. Such change creates opportunity, along with a certain degreed of confusion. As the number of discrete systems increases, so do costs. Electronics c... » read more

One-On-One: Dark Silicon
By Katherine Derbyshire - 09 Apr, 2015 - Comments: 0

Professor Michael Taylor’s research group at UC San Diego is studying ways to exploit dark silicon to optimize circuit designs for energy efficiency. He spoke with Semiconductor Engineering about the post-Dennard scaling regime, energy efficiency from integrated circuits all the way up to data centers, and how the manufacturing side can help. What follows are excerpts of that conversation. (F... » read more

UPF 3.0 Moves Toward Ratification
By Ann Mutschler - 09 Apr, 2015 - Comments: 0

[gettech id="31044" t_name="UPF"] (Unified Power Format) 3.0 — the fourth incarnation in 10 years — is moving closer to the IEEE ballot process. Erich Marschner, verification architect at [getentity id="22017" e_name="Mentor Graphics"] and vice chair of the [gettech id="31043" comment="IEEE 1801"] working group, explained the working group is as close as possible to being on schedule for... » read more

Is Dark Silicon Wasted Silicon?
By Ann Mutschler - 09 Apr, 2015 - Comments: 0

The concept of dark silicon sounds almost mysterious, but it is a simple matter of physics. With advances in technology nodes and the ability to pack more and more transistors on the same die, design engineers are reaching a wall where only a fraction of a design can be powered on due to power and thermal implications. Moreover, the challenges that force this kind of complex power managemen... » read more

Does Fast Simulation Help Debug Productivity?
By Brian Bailey - 09 Apr, 2015 - Comments: 0

It is nice when a reporter manages to get the scoop of the century, and that was the case at a lunch panel hosted by [getentity id="22032" e_name="Cadence"] at the recent Design and Verification Conference (DVCon) in Santa Clara, CA. Brian Bailey, technology editor for Semiconductor Engineer was the moderator for the panel and broke the news to the crowd. Cadence had developed a logic [getkc id... » read more

Ecosystem Changes
By Ed Sperling - 07 Apr, 2015 - Comments: 0

Semiconductor Engineering sat down to discuss changes in the semiconductor ecosystem with Kelvin Low, senior director of foundry marketing at [getentity id="22865" e_name="Samsung Semiconductor"]; John Costello, vice president of product planning at [getentity id="22849" e_name="Altera"]; Randy Smith, vice president of marketing at [getentity id="22605" e_name="Sonics"], and Michiel Ligthart, p... » read more

Challenges Mount For Patterning And Masks
By Mark LaPedus - 06 Apr, 2015 - Comments: 0

Semiconductor Engineering sat down to discuss [getkc id="80" comment="lithography"] and photomask trends with Uday Mitra, vice president and chief technology officer for the Etch Business Unit at [getentity id="22817" e_name="Applied Materials"]; Pawitter Mangat, senior manager and deputy director for EUV lithography at [getentity id="22819" comment="GlobalFoundries"]; Aki Fujimura, chief execu... » read more

Will Wearables Work Well Enough?
By Ed Sperling - 02 Apr, 2015 - Comments: 0

By Ed Sperling & Ann Steffora Mutschler The rollout of the Apple Watch later this month has reset expectations for the wearable electronics market, just as early implementations of the Pebble, Fitbit and Google Glass helped raise awareness about a new level of portability and connectivity. Early projections are for strong sales, which in turn will propel a new level of connectedness for the ... » read more

Drill Down: Embedded NVM Technology
By Ernest Worthman - 02 Apr, 2015 - Comments: 0

Many of the next-generation devices that will be seen on the IoT/E will have power, footprint, and electronic constraints as never before. Electronic flash memories (eFLASH), and their derivatives are seen as a realistic solution to many of these design constraints for small form factor and simple IoE devices. “NVM will be very important for the IoE from the perspective of saving power," ... » read more

One-on-One: Smarter Architectures
By Ed Sperling - 02 Apr, 2015 - Comments: 0

Edward Lee, distinguished professor of electrical engineering and computer science professor at the [getentity id="22165" comment="UC Berkeley"], sat down with Semiconductor Engineering to talk about what is needed to maximize the usefulness of the [getkc id="76" comment="Internet of Things"] and how our perceptions need to shift to take advantage of this technology. What follows are excerpts o... » read more

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